Podraza, Nikolas J

Nikolas J Podraza
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Positions

Professor and Chair, Physics and Astronomy , College of Natural Sciences and Mathematics

Contact Info

Nikolas.Podraza@utoledo.edu

selected publications

Article (Faculty180)
- 2018
  
  Nanocomposite (CuS)x(ZnS)1-x thin film back contact for CdTe solar cells: Toward a bifacial device. Solar Energy Materials and Solar Cells. 186:227-335.
Article (Web of Science)
- 2021
  
  Optical properties of thin film Sb2Se3 and identification of its electronic losses in photovoltaic devices. SOLAR ENERGY. 228:38-44.
  Full Text via DOI: 10.1016/j.solener.2021.09.025
- 2021
  
  Estimating Internal Stress of an Alteration Layer Formed on Corroded Boroaluminosilicate Glass through Spectroscopic Ellipsometry Analysis. ACS APPLIED MATERIALS & INTERFACES. 13:50470-50480.
  Full Text via DOI: 10.1021/acsami.1c10134 PMID: 34643085
- 2021
  
  Protecting Perovskite Solar Cells against Moisture-Induced Degradation with Sputtered Inorganic Barrier Layers. ACS APPLIED ENERGY MATERIALS. 4:7571-7578.
  Full Text via DOI: 10.1021/acsaem.1c00816
- 2021
  
  Mean Free Path of Photoelectronic Excitations in Hydrogenated Amorphous Silicon and Silicon Germanium Alloy Semiconductors. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS.
  Full Text via DOI: 10.1002/pssb.202000473
- 2021
  
  Impact of Humidity and Temperature on the Stability of the Optical Properties and Structure of MAPbI(3), MA(0.7)FA(0.3)PbI(3) and (FAPbI(3))(0.95)(MAPbBr(3))(0.05) Perovskite Thin Films. MATERIALS. 14.
  Full Text via DOI: 10.3390/ma14144054 PMID: 34300973
- 2021
  
  Enabling bifacial thin film devices by developing a back surface field using CuxAlOy. NANO ENERGY. 83.
  Full Text via DOI: 10.1016/j.nanoen.2021.105827
- 2021
  
  Epitaxial stannate pyrochlore thin films: Limitations of cation stoichiometry and electron doping. APL MATERIALS. 9.
  Full Text via DOI: 10.1063/5.0049334
- 2021
  
  The impact of processing on the optical absorption onset of CdTe thin-films and solar cells. JOURNAL OF APPLIED PHYSICS. 129.
  Full Text via DOI: 10.1063/5.0033415
- 2021
  
  Tailoring the CdS/CdSe/CdTe multilayer structure for optimization of photovoltaic device performance guided by mapping spectroscopic ellipsometry. SOLAR ENERGY MATERIALS AND SOLAR CELLS. 221.
  Full Text via DOI: 10.1016/j.solmat.2020.110907
- 2021
  
  Optical and Electronic Losses Arising from Physically Mixed Interfacial Layers in Perovskite Solar Cells. ACS APPLIED MATERIALS & INTERFACES. 13:4923-4934.
  Full Text via DOI: 10.1021/acsami.0c16364 PMID: 33470116
- 2021
  
  Analysis of non-idealities in rhomb compensators. OPTICS EXPRESS. 29:36328.
  Full Text via DOI: 10.1364/oe.440680
- 2020
  
  Semi-transparent p-type barium copper sulfide as a back contact interface layer for cadmium telluride solar cells. SOLAR ENERGY MATERIALS AND SOLAR CELLS. 218.
  Full Text via DOI: 10.1016/j.solmat.2020.110764
- 2020
  
  Low-bandgap mixed tin-lead iodide perovskites with reduced methylammonium for simultaneous enhancement of solar cell efficiency and stability. NATURE ENERGY. 5:768-+.
  Full Text via DOI: 10.1038/s41560-020-00692-7
- 2020
  
  Real-Time Optimization of Anti-Reflective Coatings for CIGS Solar Cells. MATERIALS. 13.
  Full Text via DOI: 10.3390/ma13194259 PMID: 32987795
- 2020
  
  PERC silicon PV infrared to ultraviolet optical model. SOLAR ENERGY MATERIALS AND SOLAR CELLS. 215.
  Full Text via DOI: 10.1016/j.solmat.2020.110655
- 2020
  
  Characterization of chain alignment at buried interfaces using Mueller matrix spectroscopy. MRS COMMUNICATIONS. 10:292-297.
  Full Text via DOI: 10.1557/mrc.2020.19
- 2020
  
  Anisotropic Optical and Frictional Properties of Langmuir-Blodgett Film Consisting of Uniaxially-Aligned Rod-Shaped Cellulose Nanocrystals. ADVANCED MATERIALS INTERFACES. 7.
  Full Text via DOI: 10.1002/admi.201902169
- 2020
  
  Effects of intrinsic and atmospherically induced defects in narrow bandgap (FASnI(3))(x)(MAPbI(3))(1-x) perovskite films and solar cells. JOURNAL OF CHEMICAL PHYSICS. 152.
  Full Text via DOI: 10.1063/1.5126867 PMID: 32061228
- 2020
  
  Glancing angle deposited CdTe: Nanostructured films and impact on solar cell performance. SURFACE & COATINGS TECHNOLOGY. 381.
  Full Text via DOI: 10.1016/j.surfcoat.2019.125127
- 2019
  
  Photogenerated Carrier Transport Properties in Silicon Photovoltaics. SCIENTIFIC REPORTS. 9.
  Full Text via DOI: 10.1038/s41598-019-55173-z PMID: 31831793
- 2019
  
  Substrate-Dependent Molecular and Nanostructural Orientation of Nafion Thin Films. ADVANCED FUNCTIONAL MATERIALS. 29.
  Full Text via DOI: 10.1002/adfm.201902699
- 2019
  
  Irradiance and temperature considerations in the design and deployment of high annual energy yield perovskite/CIGS tandems. SUSTAINABLE ENERGY & FUELS. 3:1841-1851.
  Full Text via DOI: 10.1039/c9se00237e
- 2019
  
  Parametric Optical Property Database for CdSe1-xSx Alloys. ELECTRONIC MATERIALS LETTERS. 15:500-504.
  Full Text via DOI: 10.1007/s13391-019-00144-9
- 2019
  
  n-i-p Nanocrystalline Hydrogenated Silicon Solar Cells with RF-Magnetron Sputtered Absorbers. MATERIALS. 12.
  Full Text via DOI: 10.3390/ma12101699 PMID: 31130599
- 2019
  
  Atmospherically induced defects in (FASnI(3))(0.6)(MAPbI(3-3x)Cl(3x))(0.4) perovskites. JOURNAL OF PHYSICS D-APPLIED PHYSICS. 52.
  Full Text via DOI: 10.1088/1361-6463/ab05b2
- 2019
  
  Emissivity of solar cell cover glass calculated from infrared reflectance measurements. SOLAR ENERGY MATERIALS AND SOLAR CELLS. 190:98-102.
  Full Text via DOI: 10.1016/j.solmat.2018.09.027
- 2019
  
  Reducing Saturation-Current Density to Realize High-Efficiency Low-Bandgap Mixed Tin-Lead Halide Perovskite Solar Cells. ADVANCED ENERGY MATERIALS. 9.
  Full Text via DOI: 10.1002/aenm.201803135
- 2018
  
  Formamidinium plus cesium lead triiodide perovskites: Discrepancies between thin film optical absorption and solar cell efficiency. SOLAR ENERGY MATERIALS AND SOLAR CELLS. 188:228-233.
  Full Text via DOI: 10.1016/j.solmat.2018.09.002
- 2018
  
  Efficient two-terminal all-perovskite tandem solar cells enabled by high-quality low-bandgap absorber layers. NATURE ENERGY. 3:1093-1100.
  Full Text via DOI: 10.1038/s41560-018-0278-x
- 2018
  
  Nanocomposite (CuS)(x)(ZnS)(1-x) thin film back contact for CdTe solar cells: Toward a bifacial device. SOLAR ENERGY MATERIALS AND SOLAR CELLS. 186:227-235.
  Full Text via DOI: 10.1016/j.solmat.2018.06.025
- 2018
  
  Optical Hall Effect of PV Device Materials. IEEE JOURNAL OF PHOTOVOLTAICS. 8:1793-1799.
  Full Text via DOI: 10.1109/JPHOTOV.2018.2869540
- 2018
  
  Optical and electrical properties of H-2 plasma-treated ZnO films prepared by atomic layer deposition using supercycles. MATERIALS SCIENCE IN SEMICONDUCTOR PROCESSING. 84:91-100.
  Full Text via DOI: 10.1016/j.mssp.2018.05.008
- 2018
  
  Structural, optical, and hole transport properties of earth-abundant chalcopyrite (CuFeS2) nanocrystals. MRS COMMUNICATIONS. 8:970-978.
  Full Text via DOI: 10.1557/mrc.2018.117
- 2018
  
  Reconfigurable near-IR metasurface based on Ge2Sb2Te5 phase-change material. OPTICAL MATERIALS EXPRESS. 8:2264-2275.
  Full Text via DOI: 10.1364/OME.8.002264
- 2018
  
  Understanding near infrared absorption in tin doped indium oxide thin films. JOURNAL OF PHYSICS D-APPLIED PHYSICS. 51.
  Full Text via DOI: 10.1088/1361-6463/aac9e8
- 2018
  
  Optical simulation of external quantum efficiency spectra of CuIn1-xGaxSe2 solar cells from spectroscopic ellipsometry inputs. JOURNAL OF ENERGY CHEMISTRY. 27:1151-1169.
  Full Text via DOI: 10.1016/j.jechem.2017.10.029
- 2018
  
  Optical properties of soda lime float glass from 3mm to 148nm (0.41 meV to 8.38 eV) by spectroscopic ellipsometry. SURFACE SCIENCE SPECTRA. 25.
  Full Text via DOI: 10.1116/1.5024390
- 2018
  
  Electronic and optical properties of vanadium oxides from first principles. COMPUTATIONAL MATERIALS SCIENCE. 146:310-318.
  Full Text via DOI: 10.1016/j.commatsci.2018.01.048
- 2018
  
  Determination of conductivity anisotropy and the role of doping in single walled carbon nanotube thin films with THz spectroscopic ellipsometry. CARBON. 129:592-597.
  Full Text via DOI: 10.1016/j.carbon.2017.12.022
- 2018
  
  Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis. APPLIED SURFACE SCIENCE. 436:779-784.
  Full Text via DOI: 10.1016/j.apsusc.2017.12.039
- 2018
  
  Reducing Operating Temperature in Photovoltaic Modules. IEEE JOURNAL OF PHOTOVOLTAICS. 8:532-540.
  Full Text via DOI: 10.1109/JPHOTOV.2017.2779842
- 2018
  
  Transparency enhancement for SrVO3 by SrTiO3 mixing: A first-principles study. COMPUTATIONAL MATERIALS SCIENCE. 144:139-146.
  Full Text via DOI: 10.1016/j.commatsci.2017.12.020
- 2018
  
  Real Time Spectroscopic Ellipsometry Analysis of First Stage CuIn1-xGaxSe2 Growth: Indium-Gallium Selenide Co-Evaporation. MATERIALS. 11.
  Full Text via DOI: 10.3390/ma11010145
- 2018
  
  Optical Hall Effect of PV Device Materials. IEEE JOURNAL OF PHOTOVOLTAICS. 8:1793-1799.
  Full Text via DOI: 10.1109/jphotov.2018.2869540
- 2018
  
  Reconfigurable near-IR metasurface based on Ge2Sb2Te5 phase-change material. OPTICAL MATERIALS EXPRESS. 8:2264.
  Full Text via DOI: 10.1364/ome.8.002264
- 2018
  
  Reducing Operating Temperature in Photovoltaic Modules. IEEE JOURNAL OF PHOTOVOLTAICS. 8:532-540.
  Full Text via DOI: 10.1109/jphotov.2017.2779842
- 2018
  
  Spectroscopic ellipsometry study of thickness and porosity of the alteration layer formed on international simple glass surface in aqueous corrosion conditions. npj Materials Degradation. 2:20.
  Full Text via DOI: 10.1038/s41529-018-0040-7
- 2017
  
  Al plus Si Interface Optical Properties Obtained in the Si Solar Cell Configuration. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. 214.
  Full Text via DOI: 10.1002/pssa.201700480
- 2017
  
  Optical properties of borosilicate glass from 3.1 mm to 210 nm (0.4 meV to 5.89 eV) by spectroscopic ellipsometry. SURFACE SCIENCE SPECTRA. 24.
  Full Text via DOI: 10.1116/1.4997898
- 2017
  
  Ellipsometric study of the optical response of ZnS:Cr for PV applications. APPLIED SURFACE SCIENCE. 421:315-319.
  Full Text via DOI: 10.1016/j.apsusc.2016.10.157
- 2017
  
  Optical properties of InP from infrared to vacuum ultraviolet studied by spectroscopic ellipsometry. APPLIED SURFACE SCIENCE. 421:813-818.
  Full Text via DOI: 10.1016/j.apsusc.2017.01.027
- 2017
  
  Spectroscopic ellipsometry determination of optical and electrical properties of aluminum doped zinc oxide. APPLIED SURFACE SCIENCE. 421:852-858.
  Full Text via DOI: 10.1016/j.apsusc.2017.01.139
- 2017
  
  Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency. APPLIED SURFACE SCIENCE. 421:601-607.
  Full Text via DOI: 10.1016/j.apsusc.2016.12.236
- 2017
  
  Morphological and optical properties of low temperature processed SnO2:F. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. 254.
  Full Text via DOI: 10.1002/pssb.201700102
- 2017
  
  Understanding and Eliminating Hysteresis for Highly Efficient Planar Perovskite Solar Cells. ADVANCED ENERGY MATERIALS. 7.
  Full Text via DOI: 10.1002/aenm.201700414
- 2017
  
  Nanostructure evolution of magnetron sputtered hydrogenated silicon thin films. JOURNAL OF APPLIED PHYSICS. 122.
  Full Text via DOI: 10.1063/1.4998455
- 2017
  
  Correlating the silicon surface passivation to the nanostructure of low-temperature a-Si:H after rapid thermal annealing. JOURNAL OF APPLIED PHYSICS. 122.
  Full Text via DOI: 10.1063/1.4994795
- 2017
  
  Optical response of mixed methylammonium lead iodide and formamidinium tin iodide perovskite thin films. AIP ADVANCES. 7.
  Full Text via DOI: 10.1063/1.4994211
- 2017
  
  Modification of reactively sputtered NiOx thin films by pulsed UV laser irradiation. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. 214.
  Full Text via DOI: 10.1002/pssa.201600414
- 2016
  
  Optical monitoring of CH3NH3PbI3 thin films upon atmospheric exposure. JOURNAL OF PHYSICS D-APPLIED PHYSICS. 49.
  Full Text via DOI: 10.1088/0022-3727/49/40/405102
- 2016
  
  Near infrared to ultraviolet anisotropic optical properties of single crystal SrLaAlO4 from spectroscopic ellipsometry. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. 253:2066-2072.
  Full Text via DOI: 10.1002/pssb.201600286
- 2016
  
  Optical band gap and infrared phonon modes of (La0.29Sr0.71)(Al0.65Ta0.36)O-3 (LSAT) single crystal from infrared to ultraviolet range spectroscopic ellipsometry. OPTICAL MATERIALS EXPRESS. 6:3210-3216.
  Full Text via DOI: 10.1364/OME.6.003210
- 2016
  
  Fabrication of Efficient Low-Bandgap Perovskite Solar Cells by Combining Formamidinium Tin Iodide with Methylammonium Lead Iodide. JOURNAL OF THE AMERICAN CHEMICAL SOCIETY. 138:12360-12363.
  Full Text via DOI: 10.1021/jacs.6b08337
- 2016
  
  Breaking Malus' law: Highly efficient, broadband, and angular robust asymmetric light transmitting metasurface. LASER & PHOTONICS REVIEWS. 10:791-798.
  Full Text via DOI: 10.1002/lpor.201500328
- 2016
  
  Parameterized complex dielectric functions of CuIn1-xGaxSe2: applications in optical characterization of compositional non-uniformities and depth profiles in materials and solar cells. PROGRESS IN PHOTOVOLTAICS. 24:1200-1213.
  Full Text via DOI: 10.1002/pip.2774
- 2016
  
  Through-the-glass spectroscopic ellipsometry for analysis of CdTe thin-film solar cells in the superstrate configuration. PROGRESS IN PHOTOVOLTAICS. 24:1055-1067.
  Full Text via DOI: 10.1002/pip.2759
- 2016
  
  Near infrared to ultraviolet optical properties of bulk single crystal and nanocrystal thin film iron pyrite. NANOTECHNOLOGY. 27.
  Full Text via DOI: 10.1088/0957-4484/27/29/295702
- 2016
  
  Effects of oxygen partial pressure, deposition temperature, and annealing on the optical response of CdS:O thin films as studied by spectroscopic ellipsometry. JOURNAL OF APPLIED PHYSICS. 120.
  Full Text via DOI: 10.1063/1.4955076
- 2016
  
  Thermal Poling of Soda-Lime Silica Glass with Nonblocking ElectrodesPart 1: Effects of Sodium Ion Migration and Water Ingress on Glass Surface Structure. JOURNAL OF THE AMERICAN CERAMIC SOCIETY. 99:1221-1230.
  Full Text via DOI: 10.1111/jace.14081
- 2016
  
  Spectroscopic Ellipsometry Studies of n-i-p Hydrogenated Amorphous Silicon Based Photovoltaic Devices. MATERIALS. 9.
  Full Text via DOI: 10.3390/ma9030128
- 2016
  
  Correlated metals as transparent conductors. NATURE MATERIALS. 15:204-+.
  Full Text via DOI: 10.1038/NMAT4493
- 2016
  
  Excimer laser assisted re-oxidation of BaTiO3 thin films on Ni metal foils. JOURNAL OF APPLIED PHYSICS. 119.
  Full Text via DOI: 10.1063/1.4937996
- 2016
  
  Correlated metals as transparent conductors. NATURE MATERIALS. 15:204-210.
  Full Text via DOI: 10.1038/nmat4493
- 2016
  
  LPCVD SiNx thin film on c-Si wafer by spectroscopic ellipsometry. SURFACE SCIENCE SPECTRA. 23:51-54.
  Full Text via DOI: 10.1116/1.4954192
- 2016
  
  Optical band gap and infrared phonon modes of (La_029Sr_071)(Al_065Ta_036)O_3 (LSAT) single crystal from infrared to ultraviolet range spectroscopic ellipsometry. OPTICAL MATERIALS EXPRESS. 6:3210.
  Full Text via DOI: 10.1364/ome.6.003210
- 2015
  
  Characterization of Structure and Growth Evolution for nc-Si:H in the Tandem Photovoltaic Device Configuration. IEEE JOURNAL OF PHOTOVOLTAICS. 5:1516-1522.
  Full Text via DOI: 10.1109/JPHOTOV.2015.2478056
- 2015
  
  Optical properties of single-crystal Gd3Ga5O12 from the infrared to ultraviolet. PHYSICA STATUS SOLIDI B-BASIC SOLID STATE PHYSICS. 252:2191-2198.
  Full Text via DOI: 10.1002/pssb.201552115
- 2015
  
  High temperature coefficient of resistance molybdenum oxide and nickel oxide thin films for microbolometer applications. OPTICAL ENGINEERING. 54.
  Full Text via DOI: 10.1117/1.OE.54.3.037101
- 2015
  
  Optical function spectra and bandgap energy of Cu2SnSe3. APPLIED PHYSICS LETTERS. 106.
  Full Text via DOI: 10.1063/1.4907202
- 2015
  
  Spectroscopic Ellipsometry Applied in the Full p-i-n a-Si:H Solar Cell Device Configuration. IEEE JOURNAL OF PHOTOVOLTAICS. 5:307-312.
  Full Text via DOI: 10.1109/JPHOTOV.2014.2362294
- 2015
  
  Characterization of Structure and Growth Evolution for nc-Si:H in the Tandem Photovoltaic Device Configuration. IEEE JOURNAL OF PHOTOVOLTAICS. 5:1516-1522.
  Full Text via DOI: 10.1109/jphotov.2015.2478056
- 2015
  
  High temperature coefficient of resistance molybdenum oxide and nickel oxide thin films for microbolometer applications. OPTICAL ENGINEERING. 54:037101.
  Full Text via DOI: 10.1117/1.oe.54.3.037101
- 2015
  
  Spectroscopic Ellipsometry Applied in the Full p-i-n a-Si:H Solar Cell Device Configuration. IEEE JOURNAL OF PHOTOVOLTAICS. 5:307-312.
  Full Text via DOI: 10.1109/jphotov.2014.2362294
- 2014
  
  Approach for extracting complex dielectric function spectra in weakly-absorbing regions. THIN SOLID FILMS. 571:548-553.
  Full Text via DOI: 10.1016/j.tsf.2014.03.020
- 2014
  
  Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics. THIN SOLID FILMS. 571:442-446.
  Full Text via DOI: 10.1016/j.tsf.2013.10.158
- 2014
  
  Electrical Activity of Boron and Phosphorus in Hydrogenated Amorphous Silicon. PHYSICAL REVIEW APPLIED. 2.
  Full Text via DOI: 10.1103/PhysRevApplied.2.054005
- 2014
  
  Optical properties of single crystal Bi4Ge3O12 from the infrared to ultraviolet. JOURNAL OF APPLIED PHYSICS. 116.
  Full Text via DOI: 10.1063/1.4898762
- 2014
  
  Applications of real-time and mapping spectroscopic ellipsometry for process development and optimization in hydrogenated silicon thin-film photovoltaics technology. SOLAR ENERGY MATERIALS AND SOLAR CELLS. 129:32-56.
  Full Text via DOI: 10.1016/j.solmat.2014.01.028
- 2014
  
  Origin of deep subgap states in amorphous indium gallium zinc oxide: Chemically disordered coordination of oxygen. APPLIED PHYSICS LETTERS. 104.
  Full Text via DOI: 10.1063/1.4883257
- 2014
  
  High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS. 4:355-361.
  Full Text via DOI: 10.1109/JPHOTOV.2013.2284380
- 2014
  
  Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In1-xGax)Se-2 Metrology. IEEE JOURNAL OF PHOTOVOLTAICS. 4:333-339.
  Full Text via DOI: 10.1109/JPHOTOV.2013.2282745
- 2014
  
  Electrical Activity of Boron and Phosphorus in Hydrogenated Amorphous Silicon. PHYSICAL REVIEW APPLIED. 2:054005.
  Full Text via DOI: 10.1103/physrevapplied.2.054005
- 2014
  
  High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS. 4:355-361.
  Full Text via DOI: 10.1109/jphotov.2013.2284380
- 2014
  
  Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In $_{{\bf 1}-{\bm x}}$Ga$_{\bm x}$ )Se$_{\bf 2}$ Metrology. IEEE JOURNAL OF PHOTOVOLTAICS. 4:333-339.
  Full Text via DOI: 10.1109/jphotov.2013.2282745
- 2013
  
  Electrical properties of plasma enhanced chemical vapor deposition a-Si:H and a-Si1-xCx:H for microbolometer applications. JOURNAL OF APPLIED PHYSICS. 114.
  Full Text via DOI: 10.1063/1.4829013
- 2013
  
  Adsorption-controlled growth of BiVO4 by molecular-beam epitaxy. APL MATERIALS. 1.
  Full Text via DOI: 10.1063/1.4824041
- 2013
  
  Band gap and structure of single crystal BiI3: Resolving discrepancies in literature. JOURNAL OF APPLIED PHYSICS. 114.
  Full Text via DOI: 10.1063/1.4813486
- 2013
  
  Large nonlinear optical coefficients in pseudo-tetragonal BiFeO3 thin films. APPLIED PHYSICS LETTERS. 103.
  Full Text via DOI: 10.1063/1.4812978
- 2013
  
  Optical Properties of Sputtered SnS Thin Films for Photovoltaic Absorbers. IEEE JOURNAL OF PHOTOVOLTAICS. 3:1084-1089.
  Full Text via DOI: 10.1109/JPHOTOV.2013.2251758
- 2013
  
  Effect of reduced dimensionality on the optical band gap of SrTiO3. APPLIED PHYSICS LETTERS. 102.
  Full Text via DOI: 10.1063/1.4798241
- 2013
  
  Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS. 3:387-393.
  Full Text via DOI: 10.1109/JPHOTOV.2012.2221081
- 2013
  
  Large-Area Compositional Mapping of Cu(In1-xGax)Se-2 Materials and Devices with Spectroscopic Ellipsometry. IEEE JOURNAL OF PHOTOVOLTAICS. 3:359-363.
  Full Text via DOI: 10.1109/JPHOTOV.2012.2216513
- 2013
  
  Optical Monitoring and Control of Three-Stage Coevaporated Cu(In1-xGax)Se-2 by Real-Time Spectroscopic Ellipsometry. IEEE JOURNAL OF PHOTOVOLTAICS. 3:375-380.
  Full Text via DOI: 10.1109/JPHOTOV.2012.2220122
- 2013
  
  Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics. IEEE JOURNAL OF PHOTOVOLTAICS. 3:387-393.
  Full Text via DOI: 10.1109/jphotov.2012.2221081
- 2013
  
  Large-Area Compositional Mapping of Cu(In$_{1-x}$Ga $_{x}$)Se $_{2}$ Materials and Devices with Spectroscopic Ellipsometry. IEEE JOURNAL OF PHOTOVOLTAICS. 3:359-363.
  Full Text via DOI: 10.1109/jphotov.2012.2216513
- 2013
  
  Optical Monitoring and Control of Three-Stage Coevaporated Cu(In $_{\bm {1-x}}$Ga$_{\bm x}$)Se $_{\bf 2}$ by Real-Time Spectroscopic Ellipsometry. IEEE JOURNAL OF PHOTOVOLTAICS. 3:375-380.
  Full Text via DOI: 10.1109/jphotov.2012.2220122
- 2013
  
  Optical Properties of Sputtered SnS Thin Films for Photovoltaic Absorbers. IEEE JOURNAL OF PHOTOVOLTAICS. 3:1084-1089.
  Full Text via DOI: 10.1109/jphotov.2013.2251758
- 2012
  
  Orthorhombic BiFeO3. PHYSICAL REVIEW LETTERS. 109.
  Full Text via DOI: 10.1103/PhysRevLett.109.247606
- 2012
  
  Microstructural evolution of thin film vanadium oxide prepared by pulsed-direct current magnetron sputtering. JOURNAL OF APPLIED PHYSICS. 112.
  Full Text via DOI: 10.1063/1.4759255
- 2012
  
  CONFORMATIONAL EFFECTS OF ADSORBED POLYMER ON THE SWELLING BEHAVIOR OF ENGINEERED CLAY MINERALS. CLAYS AND CLAY MINERALS. 60:363-373.
  Full Text via DOI: 10.1346/CCMN.2012.0600403
- 2012
  
  Low Temperature Crystallization of Metastable Nickel Manganite Spinel Thin Films. JOURNAL OF THE AMERICAN CERAMIC SOCIETY. 95:2562-2567.
  Full Text via DOI: 10.1111/j.1551-2916.2012.05201.x
- 2012
  
  Synthesis of the superlattice complex oxide Sr5Bi4Ti8O27 and its band gap behavior. APPLIED PHYSICS LETTERS. 100.
  Full Text via DOI: 10.1063/1.4722942
- 2012
  
  Electrical and optical properties of sputtered amorphous vanadium oxide thin films. JOURNAL OF APPLIED PHYSICS. 111.
  Full Text via DOI: 10.1063/1.3702451
- 2012
  
  High Energy Density, High Temperature Capacitors Utilizing Mn-Doped 0.8CaTiO(3)-0.2CaHfO(3) Ceramics. JOURNAL OF THE AMERICAN CERAMIC SOCIETY. 95:1348-1355.
  Full Text via DOI: 10.1111/j.1551-2916.2011.04962.x
- 2012
  
  Conformational Effects of Adsorbed Polymer on the Swelling Behavior of Engineered Clay Minerals. CLAYS AND CLAY MINERALS. 60:363-373.
  Full Text via DOI: 10.1346/ccmn.2012.0600403
- 2012
  
  OrthorhombicBiFeO3. PHYSICAL REVIEW LETTERS. 109:247606.
  Full Text via DOI: 10.1103/physrevlett.109.247606
- 2011
  
  Influence of microstructure and composition on hydrogenated silicon thin film properties for uncooled microbolometer applications. JOURNAL OF APPLIED PHYSICS. 110.
  Full Text via DOI: 10.1063/1.3610422
- 2011
  
  Wafer-scale self-assembled plasmonic thin films. THIN SOLID FILMS. 519:6077-6084.
  Full Text via DOI: 10.1016/j.tsf.2011.03.111
- 2011
  
  Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics. THIN SOLID FILMS. 519:2682-2687.
  Full Text via DOI: 10.1016/j.tsf.2010.11.093
- 2011
  
  Optical and structural properties of solution deposited nickel manganite thin films. THIN SOLID FILMS. 519:2919-2923.
  Full Text via DOI: 10.1016/j.tsf.2010.11.088
- 2011
  
  Spin Spray-Deposited Nickel Manganite Thermistor Films For Microbolometer Applications. JOURNAL OF THE AMERICAN CERAMIC SOCIETY. 94:516-523.
  Full Text via DOI: 10.1111/j.1551-2916.2010.04097.x
- 2010
  
  Complex dielectric functions of anodic bi-layer tantalum oxide. ELECTROCHIMICA ACTA. 55:8751-8757.
  Full Text via DOI: 10.1016/j.electacta.2010.07.077
- 2010
  
  Enhanced conversion efficiencies for pillar array solar cells fabricated from crystalline silicon with short minority carrier diffusion lengths. APPLIED PHYSICS LETTERS. 96:213503.
  Full Text via DOI: 10.1063/1.3432449
- 2010
  
  Optical properties of quasi-tetragonal BiFeO3 thin films. APPLIED PHYSICS LETTERS. 96:131907.
  Full Text via DOI: 10.1063/1.3364133
- 2010
  
  Probing mixed tetragonal/rhombohedral-like monoclinic phases in strained bismuth ferrite films by optical second harmonic generation. APPLIED PHYSICS LETTERS. 97:112903.
  Full Text via DOI: 10.1063/1.3483923
- 2009
  
  Analysis of controlled mixed-phase, amorphous plus microcrystalline. silicon thin films by real time spectroscopic ellipsometry. JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A. 27:1255-1259.
  Full Text via DOI: 10.1116/1.3212893
- 2009
  
  Experimental and theoretical study of the evolution of surface roughness in amorphous silicon films grown by low-temperature plasma-enhanced chemical vapor deposition. PHYSICAL REVIEW B. 80:085403.
  Full Text via DOI: 10.1103/physrevb.80.085403
- 2009
  
  Magnon sidebands and spin-charge coupling in bismuth ferrite probed by nonlinear optical spectroscopy. PHYSICAL REVIEW B. 79:224106.
  Full Text via DOI: 10.1103/physrevb.79.224106
- 2009
  
  Optical band gap and magnetic properties of unstrained EuTiO3 films. APPLIED PHYSICS LETTERS. 94:212509.
  Full Text via DOI: 10.1063/1.3133351
- 2009
  
  Spin-charge-lattice coupling through resonant multimagnon excitations in multiferroic BiFeO3. APPLIED PHYSICS LETTERS. 94:161905.
  Full Text via DOI: 10.1063/1.3118576
- 2008
  
  Linear and nonlinear optical properties of multifunctional PbVO3 thin films. APPLIED PHYSICS LETTERS. 92.
  Full Text via DOI: 10.1063/1.2943283
- 2008
  
  Advanced deposition phase diagrams for guiding Si : H-based multijunction solar cells. JOURNAL OF NON-CRYSTALLINE SOLIDS. 354:2435-2439.
  Full Text via DOI: 10.1016/j.jnoncrysol.2007.10.061
- 2008
  
  Fabrication and optimization of single junction nc-Si : H n-i-p solar cells using Si : H phase diagram concepts developed by real time spectroscopic ellipsometry. JOURNAL OF NON-CRYSTALLINE SOLIDS. 354:2397-2402.
  Full Text via DOI: 10.1016/j.jnoncrysol.2007.10.078
- 2008
  
  Optical band gap of BiFeO(3) grown by molecular-beam epitaxy. APPLIED PHYSICS LETTERS. 92.
  Full Text via DOI: 10.1063/1.2901160
- 2008
  
  Analysis of Si1-xGex : H thin films with graded composition and structure by real time spectroscopic ellipsometry. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. 205:892-895.
  Full Text via DOI: 10.1002/pssa.200777876
- 2008
  
  Real time spectroscopic ellipsometry of sputtered CdTe, CdS, and CdTe1-xSx thin films for photovoltaic applications. PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE. 205:901-904.
  Full Text via DOI: 10.1002/pssa.200777892
- 2008
  
  Linear and nonlinear optical properties of BiFeO3. APPLIED PHYSICS LETTERS. 92.
  Full Text via DOI: 10.1063/1.2901168
- 2008
  
  Analysis of the optical properties and structure of serial bi-deposited TiO2 chiral sculptured thin films using Mueller matrix ellipsometry. JOURNAL OF NANOPHOTONICS. 2.
  Full Text via DOI: 10.1117/1.3062210
- 2007
  
  Optimization of open circuit voltage in amorphous silicon solar cells with mixed-phase (amorphous plus nanocrystalline) p-type contacts of low nanocrystalline content. JOURNAL OF APPLIED PHYSICS. 101.
  Full Text via DOI: 10.1063/1.2714507
- 2006
  
  Deposition phase diagrams for Si1-xGex : H from real time spectroscopic ellipsometry. JOURNAL OF NON-CRYSTALLINE SOLIDS. 352:1263-1267.
  Full Text via DOI: 10.1016/j.jnoncrysol.2005.09.037
- 2006
  
  Model for the amorphous roughening transition in amorphous semiconductor deposition. JOURNAL OF NON-CRYSTALLINE SOLIDS. 352:950-954.
  Full Text via DOI: 10.1016/j.jnoncrysol.2005.12.013
- 2004
  
  Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry. THIN SOLID FILMS. 455-456:571-575.
  Full Text via DOI: 10.1016/j.tsf.2003.11.219
- 2004
  
  Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle. THIN SOLID FILMS. 455-456:14-23.
  Full Text via DOI: 10.1016/j.tsf.2003.11.191
Book Chapter (Web of Science)
- 2018
  
  Ex Situ Analysis of Multijunction Solar Cells Based on Hydrogenated Amorphous Silicon. Spectroscopic Ellipsometry for Photovoltaics. 175-200.
  Full Text via DOI: 10.1007/978-3-319-75377-5_7
- 2018
  
  High Efficiency III–V Solar Cells. Spectroscopic Ellipsometry for Photovoltaics. 415-438.
  Full Text via DOI: 10.1007/978-3-319-75377-5_14
- 2018
  
  On-line Monitoring of Photovoltaics Production. Spectroscopic Ellipsometry for Photovoltaics. 169-207.
  Full Text via DOI: 10.1007/978-3-319-95138-6_5
- 2018
  
  Optical Simulation of External Quantum Efficiency Spectra. Spectroscopic Ellipsometry for Photovoltaics. 83-138.
  Full Text via DOI: 10.1007/978-3-319-95138-6_3
- 2018
  
  Organic-Inorganic Hybrid Perovskite Solar Cells. Spectroscopic Ellipsometry for Photovoltaics. 463-507.
  Full Text via DOI: 10.1007/978-3-319-75377-5_16
- 2018
  
  Real Time Measurement, Monitoring, and Control of CuIn1−xGaxSe2 by Spectroscopic Ellipsometry. Spectroscopic Ellipsometry for Photovoltaics. 209-253.
  Full Text via DOI: 10.1007/978-3-319-95138-6_6
- 2018
  
  Real Time and In-Situ Spectroscopic Ellipsometry of CuyIn1−xGaxSe2 for Complex Dielectric Function Determination and Parameterization. Spectroscopic Ellipsometry for Photovoltaics. 281-331.
  Full Text via DOI: 10.1007/978-3-319-75377-5_11
- 2018
  
  Real Time and Mapping Spectroscopic Ellipsometry for CdTe Photovoltaics. Spectroscopic Ellipsometry for Photovoltaics. 357-413.
  Full Text via DOI: 10.1007/978-3-319-75377-5_13
- 2018
  
  Real Time and Mapping Spectroscopic Ellipsometry of Hydrogenated Amorphous and Nanocrystalline Si Solar Cells. Spectroscopic Ellipsometry for Photovoltaics. 255-315.
  Full Text via DOI: 10.1007/978-3-319-95138-6_7
- 2017
  
  Ellipsometry. 482-489.
  Full Text via DOI: 10.1016/b978-0-12-409547-2.10991-6
Proceedings Paper (Web of Science)
- 2021
  
  Evaluation of CuInSe2 Materials and Solar Cells Co-evaporated at Different Rates Based on Real Time Spectroscopic Ellipsometry Calibrations
  Full Text via DOI: 10.1109/pvsc43889.2021.9518511
- 2020
  
  Non-contacting optical probing of photovoltaic device performance. PHYSICS, SIMULATION, AND PHOTONIC ENGINEERING OF PHOTOVOLTAIC DEVICES IX.
  Full Text via DOI: 10.1117/12.2550866
- 2017
  
  Application of Mapping Spectroscopic Ellipsometry for CdSe/CdTe Solar Cells: Optimization of Low-Temperature Processed Devices with All-Sputtered Semiconductors. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 2462-2466.
- 2017
  
  Electrical Transport Properties from Long Wavelength Ellipsometry. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 3468-3472.
- 2017
  
  Impact of Infrared Optical Properties on Crystalline Si and Thin Film CdTe Solar Cells. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 2771-2775.
- 2017
  
  Influence of Deposition Parameters on Silicon Thin Films Deposited by Magnetron Sputtering. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 2646-2649.
- 2017
  
  Magnetron Sputtered Hydrogenated Silicon Thin Films: Assessment for Application in Photovoltaics. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 2582-2587.
- 2017
  
  Optical Evaluation of Perovskite Films in and for Solar Cell Device Structures. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 993-998.
- 2017
  
  Optical Properties of CdSe1-xSx and CdSe1-yTey Alloys and Their Application for CdTe Photovoltaics. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 3426-3429.
- 2016
  
  CuIn1-xGaxSe2 Solar Cells with Thin Absorbers Analyzed by Spectroscopic Ellipsometry: Insights into Quantum Efficiency and Optical/Collection Losses. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 2184-2187.
- 2016
  
  High Speed Mapping of Ga Compositional Profiles in CuIn1-xGaxSe2 Solar Cells by Spectroscopic Ellipsometry. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 3391-3395.
- 2016
  
  Optical Properties and Degradation Monitoring of CH3NH3PbI3. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 89-94.
- 2016
  
  Optimization of Multi-layered Anti-reflective Coatings for Ultra-thin Cu (In,Ga)Se-2 Solar Cells. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 1506-1510.
- 2015
  
  Characterization of Structure and Growth Evolution for nc-Si:H in the Tandem Photovoltaic Device Configuration. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2.
- 2015
  
  Effect of Molybdenum Deposition Temperature on the Performance of CuIn1-xGaxSe2 Solar Cells. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2.
- 2015
  
  Quantum Efficiency Simulations with Inputs from Spectroscopic Ellipsometry for Evaluation of Carrier Collection in a-Si:H Solar Cells. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2.
- 2015
  
  Spectroscopic Ellipsometry Studies of CH3NH3PbX3 Thin Films and their Growth Evolution. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2.
- 2015
  
  Through-the-Glass Spectroscopic Ellipsometry for Simultaneous Mapping of Coating Properties and Stress in the Glass. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2.
- 2014
  
  Evaluation of 1/f Noise in Prospective IR Imaging Thin Films. ACTIVE AND PASSIVE SMART STRUCTURES AND INTEGRATED SYSTEMS 2010, PTS 1 AND 2.
  Full Text via DOI: 10.1117/12.2054652
- 2014
  
  Investigation of Doped a-Si1-xCx:H as a Novel Back Contact Material for CdTe Solar Cells. 2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC). 2354-2359.
- 2014
  
  Mapping Spectroscopic Ellipsometry of CdTe Solar Cells for Property-Performance Correlations. 2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC). 674-679.
- 2014
  
  Real Time Spectroscopic Ellipsometry Analysis of the Three-Stages of CuIn1-xGaxSe2 Co-Evaporation. 2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC). 2060-2065.
- 2013
  
  Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2.
  Full Text via DOI: 10.1109/JPHOTOV.2012.2221081
- 2013
  
  Correlations Between Mapping Spectroscopic Ellipsometry and Solar Cell Performance for the Study of Nonuniformities in Thin (0.7 mu m) Cu(In1-xGax)Se-2 Solar Cells over Large Areas. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 1685-1690.
- 2013
  
  Effect of c-Si Doping Density on Heterojunction with Intrinsic Thin Layer (HIT) Radial Junction Solar Cells. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 2466-2469.
- 2013
  
  Growth Evolution of Si:H Prepared with SiH4 + Si2H6 as Studied by Real Time Spectroscopic Ellipsometry. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 605-609.
- 2013
  
  Large-Area Compositional Mapping of Cu(In1-xGax)Se-2 Materials and Devices with Spectroscopic Ellipsometry. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2.
  Full Text via DOI: 10.1109/JPHOTOV.2012.2216513
- 2013
  
  Multichannel Spectroscopic Ellipsometry for CdTe Photovoltaics: From Real-Time Monitoring to Large-Scale Mapping. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 1987-1991.
- 2013
  
  Optical Monitoring and Control of Three-Stage Coevaporated Cu(In1-xGax)Se-2 by Real-Time Spectroscopic Ellipsometry. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2.
  Full Text via DOI: 10.1109/JPHOTOV.2012.2220122
- 2013
  
  Optimization of a-Si:H p-i-n Solar Cells through Development of n-layer Growth Evolution Diagram and Large Area Mapping. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 1788-1793.
- 2013
  
  Real Time Spectroscopic Ellipsometry of First Stage CuIn1-xGaxSe2: Indium-Gallium Selenide co-Evaporation. 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2. 414-419.
- 2012
  
  Investigation of the Absorption Properties of Sputtered Tin Sulfide Thin Films for Photovoltaic Applications. 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC).
- 2012
  
  Optical Characterization of Structurally Graded Si1-xGex:H Thin Films. 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC).
- 2012
  
  Real Time and Post-Deposition Optical Analysis of Interfaces in CdTe Solar Cells. 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC).
- 2012
  
  Single Wall Carbon Nanotube Electrodes for Hydrogenated Amorphous Silicon Solar Cells. 2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC).
- 2011
  
  Adaptive Phase Change Metamaterials for Infrared Aperture Control. ACTIVE AND PASSIVE SMART STRUCTURES AND INTEGRATED SYSTEMS 2010, PTS 1 AND 2.
  Full Text via DOI: 10.1117/12.894892
- 2011
  
  Thin Film Silicon and Germanium for Uncooled Microbolometer Applications. ACTIVE AND PASSIVE SMART STRUCTURES AND INTEGRATED SYSTEMS 2010, PTS 1 AND 2.
  Full Text via DOI: 10.1117/12.884269
- 2011
  
  Microstructure of vanadium oxide used in microbolometers. NANOMATERIALS SYNTHESIS, INTERFACING, AND INTEGRATING IN DEVICES, CIRCUITS, AND SYSTEMS II.
  Full Text via DOI: 10.1117/12.884161
- 2009
  
  COMPARISON OF Al/ZnO AND Ag/ZnO INTERFACES OF BACK-REFLECTORS FOR THIN FILM Si:H PHOTOVOLTAICS. 2009 34TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, VOLS 1-3. 1907-1912.
- 2008
  
  Optimization of Si:H multijunction n-i-p solar cells through the development of deposition phase diagrams. PVSC: 2008 33RD IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, VOLS 1-4. 1670-1675.
- 2008
  
  PLASMONIC CHARACTERISTICS OF Ag/ZnO BACK-REFLECTORS FOR THIN FILM Si PHOTOVOLTAICS. PVSC: 2008 33RD IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE, VOLS 1-4. 679-684.
- 2008
  
  Spectroscopic ellipsometry studies of In2S3 top window and Mo back contacts in chalcopyrite photovoltaics technology. ADVANCED PRECISION ENGINEERING. 1244-1248.
- 2008
  
  Analysis of Compositionally and Structurally Graded Si:H and Si1−xGex:H Thin Films by Real Time Spectroscopic Ellipsometry. ADVANCED PRECISION ENGINEERING. 1066-A10-01.
  Full Text via DOI: 10.1557/proc-1066-a10-01
- 2008
  
  Spectroscopic ellipsometry studies of In2S3 top window and Mo back contacts in chalcopyrite photovoltaics technology. ADVANCED PRECISION ENGINEERING. 1244-1248.
  Full Text via DOI: 10.1002/pssc.200777889
- 2007
  
  Advanced deposition phase diagrams for guiding Si : H-based multijunction solar cells. AMORPHOUS AND POLYCRYSTALLINE THIN-FILM SILICON SCIENCE AND TECHNOLOGY 2007. 347-352.
- 2007
  
  Analysis and optimization of thin film photovoltaic materials and device fabrication by real time spectroscopic ellipsometry. PHOTOVOLTAIC CELL AND MODULE TECHNOLOGIES.
  Full Text via DOI: 10.1117/12.736362
- 2007
  
  Dielectric functions of a-Si1-xGex : H versus ge content, temperature, and processing: Advances in optical function parameterization. Amorphous and Polycrystalline Thin-Film Silicon Science and Technology 2006. 259-264.
- 2007
  
  Surface roughening transition in Si1-xGex : H thin films. Amorphous and Polycrystalline Thin-Film Silicon Science and Technology 2006. 55-60.
- 2006
  
  Multilayer analysis of the CdTe solar cell structure by spectroscopic ellipsometry. CONFERENCE RECORD OF THE 2006 IEEE 4TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION, VOLS 1 AND 2. 475-478.
- 2006
  
  Origin of optical losses in Ag/ZnO back-reflectors for thin film Si photovoltaics. CONFERENCE RECORD OF THE 2006 IEEE 4TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION, VOLS 1 AND 2. 1732-+.
- 2006
  
  Real time spectroscopic ellipsometry of sputtered CdTe: Effect of growth temperature on structural and optical properties. CONFERENCE RECORD OF THE 2006 IEEE 4TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION, VOLS 1 AND 2. 392-395.
- 2006
  
  Roughness and phase evolution in Si1-xGex : H: Guidance for multijunction photovoltaics. CONFERENCE RECORD OF THE 2006 IEEE 4TH WORLD CONFERENCE ON PHOTOVOLTAIC ENERGY CONVERSION, VOLS 1 AND 2. 1657-+.
- 2005
  
  Development of deposition phase diagrams for thin film Si : H and Si1-xGex : H using real time spectroscopic ellipsometry. Amorphous and Nanocrystalline Silicon Science and Technology-2005. 43-48.
- 2005
  
  Multichannel mueller matrix analysis of the evolution of the microscopic roughness and texture during ZnO : Ai chemical etching. CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005. 1524-1527.
- 2005
  
  Optical properties of transparent conducting oxide sculptured thin films for applications in thin film silicon photovoltaics. CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005. 1428-1431.
- 2005
  
  Real time analysis of magnetron-sputtered thin-film CdTe by multichannel spectroscopic ellipsometry. THIN-FILM COMPOUND SEMICONDUCTOR PHOTOVOLTAICS. 9-14.
- 2005
  
  Real time spectroscopic ellipsometry of thin film Si1-xGex : H: Phase diagrams for optimization in photovoltaics applications. CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005. 1393-1396.
- 2005
  
  Transparent conducting oxide sculptured thin films for photovoltaic applications. THIN-FILM COMPOUND SEMICONDUCTOR PHOTOVOLTAICS. 273-278.
- Optical properties of transparent conducting oxide sculptured thin films for application in thin film silicon photovoltaics
  Full Text via DOI: 10.1109/pvsc.2005.1488409
- Real time spectroscopic ellipsometry of thin film CdTe deposition by magnetron sputtering for photovoltaic applications
  Full Text via DOI: 10.1109/pvsc.2005.1488169
- Real time spectroscopic ellipsometry of thin film Si/sub 1-x/Ge/sub x/:H: phase diagrams for optimization in photovoltaics applications
  Full Text via DOI: 10.1109/pvsc.2005.1488400

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Nikolas J Podraza

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