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Analysis of controlled mixed-phase, amorphous plus microcrystalline. silicon thin films by real time spectroscopic ellipsometry
Article (Web of Science)
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cited authors
Podraza, N. J.; Li, Jing; Wronski, C. R.; Dickey, E. C.; Collins, R. W.
authors
Podraza, Nikolas J
publication date
November 1, 2009
webpage
Web of Science
published in
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
Journal
Research
category
PHYSICS, APPLIED
Category
Additional Document Info
start page
1255
end page
1259
volume
27
issue
6