Through-the-Glass Spectroscopic Ellipsometry for Simultaneous Mapping of Coating Properties and Stress in the Glass

Proceedings Paper (Web of Science)

• cited authors: Li, Jian; Pradhan, Puja; Koirala, Prakash; Tan, Xinxuan; Sang, Baosheng; Stanbery, Billy J.; Podraza, Nikolas J.; Collins, Robert W.; IEEE
• authors: Podraza, Nikolas J
• publication date: January 1, 2015
• webpage: Web of Science
• published in: 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2 Book

author keyword

• ellipsometry
• glass
• mapping
• optical retarders
• refractive index
• stress
• thin films

• category: ENGINEERING, ELECTRICAL & ELECTRONIC Category