Overview
cited authors
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Li, Jian; Pradhan, Puja; Koirala, Prakash; Tan, Xinxuan; Sang, Baosheng; Stanbery, Billy J.; Podraza, Nikolas J.; Collins, Robert W.; IEEE
Research
author keyword
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ellipsometry
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glass
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mapping
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optical retarders
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refractive index
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stress
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thin films