Through-the-Glass Spectroscopic Ellipsometry for Simultaneous Mapping of Coating Properties and Stress in the Glass Proceedings Paper (Web of Science)

cited authors

  • Li, Jian; Pradhan, Puja; Koirala, Prakash; Tan, Xinxuan; Sang, Baosheng; Stanbery, Billy J.; Podraza, Nikolas J.; Collins, Robert W.; IEEE

publication date

  • January 1, 2015


author keyword

  • ellipsometry
  • glass
  • mapping
  • optical retarders
  • refractive index
  • stress
  • thin films