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Development of deposition phase diagrams for thin film Si : H and Si1-xGex : H using real time spectroscopic ellipsometry
Proceedings Paper (Web of Science)
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cited authors
Podraza, NJ; Ferreira, GM; Wronski, CR; Collins, RW; Collins, RW; Taylor, PC; Kondo, M; Carius, R; Biswas, R
authors
Podraza, Nikolas J
publication date
January 1, 2005
webpage
Web of Science
published in
Amorphous and Nanocrystalline Silicon Science and Technology-2005
Book
Research
category
MATERIALS SCIENCE, CHARACTERIZATION & TESTING
Category
Additional Document Info
start page
43
end page
48
volume
862