Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics Proceedings Paper (Web of Science)

cited authors

  • Dahal, Lila R.; Huang, Zhiquan; Attygalle, Dinesh; Salupo, Carl; Marsillac, Sylvain; Podraza, Nikolas J.; Collins, Robert W.; IEEE

publication date

  • January 1, 2013


author keyword

  • Amorphous semiconductors
  • ellipsometry
  • hydrogen
  • nanocrystals
  • photovoltaic (PV) cells
  • silicon