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Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics
Proceedings Paper (Web of Science)
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cited authors
Dahal, Lila R.; Huang, Zhiquan; Attygalle, Dinesh; Salupo, Carl; Marsillac, Sylvain; Podraza, Nikolas J.; Collins, Robert W.; IEEE
authors
Podraza, Nikolas J
publication date
January 1, 2013
webpage
Web of Science
published in
2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2
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Research
author keyword
Amorphous semiconductors
ellipsometry
hydrogen
nanocrystals
photovoltaic (PV) cells
silicon
category
ENGINEERING, ELECTRICAL & ELECTRONIC
Category