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High-Speed Imaging/Mapping Spectroscopic Ellipsometry for In-Line Analysis of Roll-to-Roll Thin-Film Photovoltaics
Article (Web of Science)
International Collaboration
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Research
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cited authors
Shan, Ambalanath; Fried, Miklos; Juhasz, Gyoergy; Major, Csaba; Polgar, Oliver; Nemeth, Agoston; Petrik, Peter; Dahal, Lila R.; Chen, Jie; Huang, Zhiquan; Podraza, Nikolas J.; Collins, Robert W.
authors
Podraza, Nikolas J
publication date
January 1, 2014
webpage
Web of Science
published in
IEEE JOURNAL OF PHOTOVOLTAICS
Journal
Research
author keyword
Ellipsometry
photovoltaic cells
thin film
category
PHYSICS, APPLIED
Category
Additional Document Info
start page
355
end page
361
volume
4
issue
1