Real time spectroscopic ellipsometry of sputtered CdTe, CdS, and CdTe1-xSx thin films for photovoltaic applications

Article (Web of Science)

• cited authors: Li, Jian; Podraza, N. J.; Collins, R. W.
• authors: Podraza, Nikolas J
• publication date: April 1, 2008
• webpage: Web of Science
• published in: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE Journal
• category: PHYSICS, CONDENSED MATTER Category
• start page: 901
• end page: 904
• volume: 205
• issue: 4