Overview
cited authors
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Pradhan, Puja; Aryal, Puruswottam; Attygalle, Dinesh; Ibdah, Abdel-Rahman; Koirala, Prakash; Li, Jian; Bhandari, Khagendra P.; Liyanage, Geethika K.; Ellingson, Randy J.; Heben, Michael J.; Marsillac, Sylvain; Collins, Robert W.; Podraza, Nikolas J.
Research
author keyword
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CuIn1-xGaxSe2
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III2-VI3 semiconductor materials
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complex dielectric function
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compositional analysis
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photovoltaic cells
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real time analysis
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spectroscopic ellipsometry
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thickness measurement