Multichannel mueller matrix analysis of the evolution of the microscopic roughness and texture during ZnO : Ai chemical etching

Proceedings Paper (Web of Science)

• cited authors: Chen, C; Ross, C; Podraza, NJ; Wronski, CR; Collins, RW; IEEE
• authors: Podraza, Nikolas J
• publication date: January 1, 2005
• webpage: Web of Science
• published in: CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005 Book
• category: PHYSICS, APPLIED Category
• start page: 1524
• end page: 1527