Overview
cited authors
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Aryal, Puruswottam; Attygalle, Dinesh; Pradhan, Puja; Podraza, Nikolas J.; Marsillac, Sylvain; Collins, Robert W.; IEEE
Research
author keyword
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Ellipsometry
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gallium-based semiconductor materials
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optical variables measurement
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photovoltaic (PV) cells
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semiconductor film
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thickness measurement