Large-Area Compositional Mapping of Cu(In1-xGax)Se-2 Materials and Devices with Spectroscopic Ellipsometry

Proceedings Paper (Web of Science)

• cited authors: Aryal, Puruswottam; Attygalle, Dinesh; Pradhan, Puja; Podraza, Nikolas J.; Marsillac, Sylvain; Collins, Robert W.; IEEE
• authors: Podraza, Nikolas J
• publication date: January 1, 2013
• webpage: Web of Science
• published in: 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2 Book

author keyword

• Ellipsometry
• gallium-based semiconductor materials
• optical variables measurement
• photovoltaic (PV) cells
• semiconductor film
• thickness measurement

• category: ENGINEERING, ELECTRICAL & ELECTRONIC Category