Large-Area Compositional Mapping of Cu(In1-xGax)Se-2 Materials and Devices with Spectroscopic Ellipsometry Proceedings Paper (Web of Science)

cited authors

  • Aryal, Puruswottam; Attygalle, Dinesh; Pradhan, Puja; Podraza, Nikolas J.; Marsillac, Sylvain; Collins, Robert W.; IEEE

publication date

  • January 1, 2013


author keyword

  • Ellipsometry
  • gallium-based semiconductor materials
  • optical variables measurement
  • photovoltaic (PV) cells
  • semiconductor film
  • thickness measurement