Analysis of the optical properties and structure of serial bi-deposited TiO2 chiral sculptured thin films using Mueller matrix ellipsometry Article (Web of Science)

cited authors

  • Podraza, Nikolas J.; Pursel, Sean M.; Chen, Chi; Horn, Mark W.; Collins, Robert W.

authors

publication date

  • January 1, 2008

webpage

published in

author keyword

  • anisotropy
  • ellipsometry
  • thin films

category

volume

  • 2