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Optical Characterization of Structurally Graded Si1-xGex:H Thin Films
Proceedings Paper (Web of Science)
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cited authors
Podraza, Nikolas J.; Saint John, David B.; IEEE
authors
Podraza, Nikolas J
publication date
January 1, 2012
webpage
Web of Science
published in
2012 38TH IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC)
Conference (Web of Science)
Research
author keyword
ellipsometry
metrology
photovoltaic cells
refractive index
silicon
silicon germanium
category
PHYSICS, APPLIED
Category