Optical Characterization of Structurally Graded Si1-xGex:H Thin Films Proceedings Paper (Web of Science)

cited authors

  • Podraza, Nikolas J.; Saint John, David B.; IEEE

publication date

  • January 1, 2012

webpage

published in

author keyword

  • ellipsometry
  • metrology
  • photovoltaic cells
  • refractive index
  • silicon
  • silicon germanium

category