Analysis and optimization of thin film photovoltaic materials and device fabrication by real time spectroscopic ellipsometry Proceedings Paper (Web of Science)

International Collaboration

cited authors

  • Li, Jian; Stoke, Jason A.; Podraza, Nikolas J.; Sainju, Deepak; Parikh, Anuja; Cao, Xinmin; Khatri, Himal; Barreau, Nicolas; Marsillac, Sylvain; Deng, Xunming; Collins, Robert W.; VonRoedern, B; Delahoy, AE

authors

publication date

  • January 1, 2007

webpage

published in

author keyword

  • CIGS
  • CdS
  • CdTe
  • CdTe1-xSx
  • CuIn1-xGaxSe2
  • In2S3
  • Mo
  • a-Si : H
  • ellipsometry
  • magnetron sputtering
  • photovoltaic devices
  • photovoltaic materials
  • photovoltaics
  • plasma-enhanced chemical vapor deposition (PECVD)
  • real time spectroscopic ellipsometry (RTSE)
  • solar cells
  • spectroscopic ellipsometry (SE)
  • thin films

category

volume

  • 6651