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Analysis and optimization of thin film photovoltaic materials and device fabrication by real time spectroscopic ellipsometry
Proceedings Paper (Web of Science)
International Collaboration
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cited authors
Li, Jian; Stoke, Jason A.; Podraza, Nikolas J.; Sainju, Deepak; Parikh, Anuja; Cao, Xinmin; Khatri, Himal; Barreau, Nicolas; Marsillac, Sylvain; Deng, Xunming; Collins, Robert W.; VonRoedern, B; Delahoy, AE
authors
Deng, Xunming
Podraza, Nikolas J
publication date
January 1, 2007
webpage
Web of Science
published in
PHOTOVOLTAIC CELL AND MODULE TECHNOLOGIES
Book
Research
author keyword
CIGS
CdS
CdTe
CdTe1-xSx
CuIn1-xGaxSe2
In2S3
Mo
a-Si : H
ellipsometry
magnetron sputtering
photovoltaic devices
photovoltaic materials
photovoltaics
plasma-enhanced chemical vapor deposition (PECVD)
real time spectroscopic ellipsometry (RTSE)
solar cells
spectroscopic ellipsometry (SE)
thin films
category
OPTICS
Category
Additional Document Info
volume
6651