Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry
Article (Web of Science)
Overview
Additional Document Info
View All
Overview
authors
Podraza, Nikolas J
Chen, Chi
An, Ilsin
Ferreira, G.M.
Rovira, P.I.
Messier, R.
publication date
2004
webpage
http://dx.doi.org/10.1016/j.tsf.2003.11.219
published in
THIN SOLID FILMS
Journal
Additional Document Info
number of pages
4
start page
571
end page
575
volume
455-456