Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics Article (Web of Science) Proceedings Paper (Web of Science)

cited authors

  • Koirala, Prakash; Attygalle, Dinesh; Aryal, Puruswottam; Pradhan, Puja; Chen, Jie; Marsillac, Sylvain; Ferlauto, Andre S.; Podraza, Nikolas J.; Collins, Robert W.

publication date

  • November 28, 2014


published in

author keyword

  • Cadmium telluride
  • Copper indium gallium diselenide
  • Real time spectroscopic ellipsometry


start page

  • 442

end page

  • 446


  • 571