Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics
Article (Web of Science)
Proceedings Paper (Web of Science)
Overview
Research
Additional Document Info
View All
Overview
cited authors
Koirala, Prakash; Attygalle, Dinesh; Aryal, Puruswottam; Pradhan, Puja; Chen, Jie; Marsillac, Sylvain; Ferlauto, Andre S.; Podraza, Nikolas J.; Collins, Robert W.
authors
Podraza, Nikolas J
publication date
November 28, 2014
webpage
Web of Science
published in
THIN SOLID FILMS
Journal
Research
author keyword
Cadmium telluride
Copper indium gallium diselenide
Real time spectroscopic ellipsometry
category
PHYSICS, CONDENSED MATTER
Category
Additional Document Info
start page
442
end page
446
volume
571