Real time spectroscopic ellipsometry of sputtered CdTe: Effect of growth temperature on structural and optical properties Proceedings Paper (Web of Science)

cited authors

  • Li, Jian; Chen, Jie; Podraza, N. J.; Collins, R. W.; IEEE

publication date

  • January 1, 2006

webpage

category

start page

  • 392

end page

  • 395