Correlations Between Mapping Spectroscopic Ellipsometry and Solar Cell Performance for the Study of Nonuniformities in Thin (0.7 mu m) Cu(In1-xGax)Se-2 Solar Cells over Large Areas Proceedings Paper (Web of Science)

cited authors

  • Aryal, Puruswottam; Attygalle, Dinesh; Pradhan, Puja; Ibdah, Abdel-Rahman A.; Aryal, Krishna; Podraza, N. J.; Marsillac, S.; Rockett, A. A.; Collins, R. W.; IEEE

publication date

  • January 1, 2013


author keyword

  • ellipsometry
  • gallium-based semiconductor materials
  • photovoltaic cells
  • thickness measurement


start page

  • 1685

end page

  • 1690