Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics Article (Web of Science) Proceedings Paper (Web of Science)

cited authors

  • Dahal, Lila Raj; Sainju, Deepak; Podraza, N. J.; Marsillac, S.; Collins, R. W.

authors

publication date

  • February 28, 2011

webpage

published in

author keyword

  • Interfaces
  • Metal films
  • Plasmons
  • Real time spectroscopic ellipsometry
  • Reflectors
  • Thin silicon solar cells
  • Zinc oxide

category

start page

  • 2682

end page

  • 2687

volume

  • 519

issue

  • 9