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Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics
Article (Web of Science)
Proceedings Paper (Web of Science)
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cited authors
Dahal, Lila Raj; Sainju, Deepak; Podraza, N. J.; Marsillac, S.; Collins, R. W.
authors
Podraza, Nikolas J
publication date
February 28, 2011
webpage
Web of Science
published in
THIN SOLID FILMS
Journal
Research
author keyword
Interfaces
Metal films
Plasmons
Real time spectroscopic ellipsometry
Reflectors
Thin silicon solar cells
Zinc oxide
category
PHYSICS, CONDENSED MATTER
Category
Additional Document Info
start page
2682
end page
2687
volume
519
issue
9