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Optical Monitoring and Control of Three-Stage Coevaporated Cu(In1-xGax)Se-2 by Real-Time Spectroscopic Ellipsometry
Article (Web of Science)
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cited authors
Attygalle, Dinesh; Ranjan, Vikash; Aryal, Puruswottam; Pradhan, Puja; Marsillac, Sylvain; Podraza, Nikolas J.; Collins, Robert W.
authors
Podraza, Nikolas J
publication date
January 1, 2013
webpage
Web of Science
published in
IEEE JOURNAL OF PHOTOVOLTAICS
Journal
Research
author keyword
Ellipsometry
monitoring
optical variables measurement
photovoltaic (PV) cells
process control
semiconductor film
thickness measurement
category
PHYSICS, APPLIED
Category
Additional Document Info
start page
375
end page
380
volume
3
issue
1