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Analysis of Si1-xGex : H thin films with graded composition and structure by real time spectroscopic ellipsometry
Article (Web of Science)
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cited authors
Podraza, N. J.; Li, Jing; Wronski, C. R.; Dickey, E. C.; Horn, M. W.; Collins, R. W.
authors
Podraza, Nikolas J
publication date
April 1, 2008
webpage
Web of Science
published in
PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE
Journal
Research
category
PHYSICS, CONDENSED MATTER
Category
Additional Document Info
start page
892
end page
895
volume
205
issue
4