Analysis of Si1-xGex : H thin films with graded composition and structure by real time spectroscopic ellipsometry

Article (Web of Science)

• cited authors: Podraza, N. J.; Li, Jing; Wronski, C. R.; Dickey, E. C.; Horn, M. W.; Collins, R. W.
• authors: Podraza, Nikolas J
• publication date: April 1, 2008
• webpage: Web of Science
• published in: PHYSICA STATUS SOLIDI A-APPLICATIONS AND MATERIALS SCIENCE Journal
• category: PHYSICS, CONDENSED MATTER Category
• start page: 892
• end page: 895
• volume: 205
• issue: 4