Overview
cited authors
-
Saint John, D. B.; Shin, H. -B.; Lee, M. -Y.; Dickey, E. C.; Podraza, N. J.; Jackson, T. N.; Andresen, BF; Fulop, GF; Norton, PR
Research
author keyword
-
1/f noise
-
amorphous germanium
-
amorphous silicon
-
ellipsometry
-
microbolometer