Thin Film Silicon and Germanium for Uncooled Microbolometer Applications

Proceedings Paper (Web of Science)

• cited authors: Saint John, D. B.; Shin, H. -B.; Lee, M. -Y.; Dickey, E. C.; Podraza, N. J.; Jackson, T. N.; Andresen, BF; Fulop, GF; Norton, PR
• authors: Podraza, Nikolas J
• publication date: January 1, 2011
• webpage: Web of Science
• published in: ACTIVE AND PASSIVE SMART STRUCTURES AND INTEGRATED SYSTEMS 2010, PTS 1 AND 2 Book

author keyword

• 1/f noise
• amorphous germanium
• amorphous silicon
• ellipsometry
• microbolometer

• category: OPTICS Category
• volume: 8012