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Correlations Between Mapping Spectroscopic Ellipsometry Results and Solar Cell Performance for Evaluations of Nonuniformity in Thin-Film Silicon Photovoltaics
Article (Web of Science)
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cited authors
Dahal, Lila R.; Huang, Zhiquan; Attygalle, Dinesh; Salupo, Carl; Marsillac, Sylvain; Podraza, Nikolas J.; Collins, Robert W.
authors
Podraza, Nikolas J
publication date
January 1, 2013
webpage
Web of Science
published in
IEEE JOURNAL OF PHOTOVOLTAICS
Journal
Research
author keyword
Amorphous semiconductors
ellipsometry
hydrogen
nanocrystals
photovoltaic (PV) cells
silicon
category
PHYSICS, APPLIED
Category
Additional Document Info
start page
387
end page
393
volume
3
issue
1