Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In1-xGax)Se-2 Metrology Article (Web of Science)

cited authors

  • Aryal, Puruswottam; Pradhan, Puja; Attygalle, Dinesh; Ibdah, Abdel-Rahman A.; Aryal, Krishna; Ranjan, Vikash; Marsillac, Sylvain; Podraza, Nikolas J.; Collins, Robert W.

authors

publication date

  • January 1, 2014

webpage

published in

author keyword

  • Ellipsometry
  • gallium-based semiconductor materials
  • photovoltaic (PV) cells
  • thickness measurement

category

start page

  • 333

end page

  • 339

volume

  • 4

issue

  • 1