Estimating Internal Stress of an Alteration Layer Formed on Corroded Boroaluminosilicate Glass through Spectroscopic Ellipsometry Analysis Article (Web of Science)

Industry Collaboration International Collaboration

cited authors

  • Kaya, Huseyin; Dien Ngo; Hahn, Seung Ho; Li, Mingxiao; He, Hongtu; Yedikarde, Beyza; Sokmen, Ilkay; Pester, Christian W.; Podraza, Nikolas J.; Gin, Stephane; Kim, Seong H.

publication date

  • October 27, 2021


published in


  • glass corrosion
  • internal stress in thin films
  • porous materials
  • prism coupler
  • spectroscopic ellipsometry

start page

  • 50470

end page

  • 50480


  • 13


  • 42