Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis Article (Web of Science)

cited authors

  • Junda, Maxwell M.; Gautam, Laxmi Karki; Collins, Robert W.; Podraza, Nikolas J.

publication date

  • April 1, 2018


published in

author keyword

  • Hydrogenated amorphous silicon
  • Real time spectroscopic ellipsometry
  • Virtual interface analysis


start page

  • 779

end page

  • 784


  • 436