Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis

Article (Web of Science)

• cited authors: Junda, Maxwell M.; Gautam, Laxmi Karki; Collins, Robert W.; Podraza, Nikolas J.
• authors: Podraza, Nikolas J
• publication date: April 1, 2018
• webpage: Web of Science
• published in: APPLIED SURFACE SCIENCE Journal

author keyword

• Hydrogenated amorphous silicon
• Real time spectroscopic ellipsometry
• Virtual interface analysis

• category: PHYSICS, CONDENSED MATTER Category
• start page: 779
• end page: 784
• volume: 436