Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency Article (Web of Science)

cited authors

  • Ibdah, Abdel-Rahman; Koirala, Prakash; Aryal, Puruswottam; Pradhan, Puja; Marsillac, Sylvain; Rockett, Angus A.; Podraza, Nikolas J.; Collins, Robert W.

authors

publication date

  • November 1, 2017

webpage

published in

author keyword

  • Quantum efficiency
  • Spectroscopic ellipsometry
  • Thin film photovoltaics

category

start page

  • 601

end page

  • 607

volume

  • 421