Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency Article (Web of Science)

cited authors

  • Ibdah, Abdel-Rahman; Koirala, Prakash; Aryal, Puruswottam; Pradhan, Puja; Marsillac, Sylvain; Rockett, Angus A.; Podraza, Nikolas J.; Collins, Robert W.

publication date

  • November 1, 2017


published in

author keyword

  • Quantum efficiency
  • Spectroscopic ellipsometry
  • Thin film photovoltaics


start page

  • 601

end page

  • 607


  • 421