Real-Time, In-Line, and Mapping Spectroscopic Ellipsometry for Applications in Cu(In $_{{\bf 1}-{\bm x}}$Ga$_{\bm x}$ )Se$_{\bf 2}$ Metrology Article (Web of Science)

authors

publication date

  • 2014

published in

number of pages

  • 6

start page

  • 333

end page

  • 339

volume

  • 4

issue

  • 1