Real Time Spectroscopic Ellipsometry Analysis of the Three-Stages of CuIn1-xGaxSe2 Co-Evaporation

Proceedings Paper (Web of Science)

• cited authors: Pradhan, Puja; Aryal, Puruswottam; Ibdah, Abdel-Rahman; Aryal, Krishna; Li, Jian; Podraza, N. J.; Marsillac, S.; Collins, R. W.; IEEE
• authors: Podraza, Nikolas J
• publication date: January 1, 2014
• webpage: Web of Science
• published in: 2014 IEEE 40TH PHOTOVOLTAIC SPECIALIST CONFERENCE (PVSC) Conference (Web of Science)

author keyword

• CIGS
• ellipsometry
• photovoltaic cells
• thickness measurement

• category: ENGINEERING, ELECTRICAL & ELECTRONIC Category
• start page: 2060
• end page: 2065