Electrical Transport Properties from Long Wavelength Ellipsometry

Proceedings Paper (Web of Science)

• cited authors: Uprety, Prakash; Junda, Maxwell M.; Subedi, Indra; Slocum, Michael A.; Forbes, David V.; Hubbard, Seth M.; Podraza, Nikolas J.; IEEE
• authors: Podraza, Nikolas J
• publication date: January 1, 2017
• webpage: Web of Science
• published in: 2012 IEEE 38TH PHOTOVOLTAIC SPECIALISTS CONFERENCE (PVSC), VOL 2 Book

author keyword

• CdTe
• Drude model
• InP
• Long wavelength ellipsometry
• Si wafer
• THz
• ZnO: Al

• category: PHYSICS, APPLIED Category
• start page: 3468
• end page: 3472