Real time analysis of magnetron-sputtered thin-film CdTe by multichannel spectroscopic ellipsometry Proceedings Paper (Web of Science)

cited authors

  • Li, J; Chen, J; Zapien, JA; Podraza, NJ; Chen, C; Drayton, J; Vasko, A; Gupta, A; Wang, SL; Collins, RW; Compaan, AD; Shafarman, W; Gessert, T; Niki, S; Siebentritt, S

publication date

  • January 1, 2005



start page

  • 9

end page

  • 14


  • 865