Optical monitoring of CH3NH3PbI3 thin films upon atmospheric exposure

Article (Web of Science)

• cited authors: Ghimire, Kiran; Zhao, Dewei; Cimaroli, Alex; Ke, Weijun; Yan, Yanfa; Podraza, Nikolas J.

authors

• Podraza, Nikolas J
• Yan, Yanfa

• publication date: October 12, 2016
• webpage: Web of Science
• published in: JOURNAL OF PHYSICS D-APPLIED PHYSICS Journal

author keyword

• degradation
• methyl ammonium lead iodide
• spectroscopic ellipsometry
• thin film

• category: PHYSICS, APPLIED Category
• volume: 49
• issue: 40