Large-Area Compositional Mapping of Cu(In1-xGax)Se-2 Materials and Devices with Spectroscopic Ellipsometry Article (Web of Science)

cited authors

  • Aryal, Puruswottam; Attygalle, Dinesh; Pradhan, Puja; Podraza, Nikolas J.; Marsillac, Sylvain; Collins, Robert W.

authors

publication date

  • January 1, 2013

webpage

published in

author keyword

  • Ellipsometry
  • gallium-based semiconductor materials
  • optical variables measurement
  • photovoltaic (PV) cells
  • semiconductor film
  • thickness measurement

category

start page

  • 359

end page

  • 363

volume

  • 3

issue

  • 1