Real time spectroscopic ellipsometry of thin film Si1-xGex : H: Phase diagrams for optimization in photovoltaics applications Proceedings Paper (Web of Science)

cited authors

Podraza, NJ; Ferreira, GM; Albert, ML; Chen, C; Wronski, CR; Collins, RW; IEEE

authors

Podraza, Nikolas J

publication date

January 1, 2005

webpage

Web of Science

published in

CONFERENCE RECORD OF THE THIRTY-FIRST IEEE PHOTOVOLTAIC SPECIALISTS CONFERENCE - 2005 Book

category

PHYSICS, APPLIED Category

start page

1393

end page

1396