THIN SOLID FILMS Journal

publication venue for

Quasi-achromatic rhomb compensator: Mueller matrix analysis versus azimuthal angle. 764. 2023
Energy, temperature, and deposition angle dependence of Cd and Te-2 deposited on CdTe. 697. 2020
First principles investigation into the phase stability and enhanced hardness of TiN-ScN and TiN-YN alloys. 688. 2019
Ceramic coating for delayed degradation of Mg-1.2Zn-0.5Ca-0.5Mn bone fixation and instrumentation. 687. 2019
Buffer/absorber interface recombination reduction and improvement of back-contact barrier height in CdTe solar cells. 685:385-392. 2019
Fabrication of optically smooth Sn thin films. 616:311-315. 2016
Spectroscopic ellipsometry studies of 3-stage deposition of CuIn1-xGaxSe2 on Mo-coated glass and stainless steel substrates. 606:113-119. 2016
Two step technology for porous ZnO nanosystem formation for potential use in hydrogen gas sensors. 604:48-54. 2016
Approach for extracting complex dielectric function spectra in weakly-absorbing regions. 571:548-553. 2014
Real time spectroscopic ellipsometry for analysis and control of thin film polycrystalline semiconductor deposition in photovoltaics. 571:442-446. 2014
An ab initio computational study of pure Zn3N2 and its native point defects and dopants Cu, Ag and Au. 564:331-338. 2014
Effect of laser irradiation on gas sensing properties of sol-gel derived nanocrystalline Al-doped ZnO thin films. 562:585-591. 2014
Fabrication and characterization of high-efficiency CdTe-based thin-film solar cells on commercial SnO2:F-coated soda-lime glass substrates. 549:30-35. 2013
Reactive radio frequency sputtering deposition and characterization of zinc nitride and oxynitride thin films. 520:1698-1704. 2012
Optimization of indium tin oxide by pulsed DC power on single junction amorphous silicon solar cells. 519:6053-6058. 2011
Wafer-scale self-assembled plasmonic thin films. 519:6077-6084. 2011
Structural and electronic properties of beta-In2X3 (X = O, S, Se, Te) using ab initio calculations. 519:5679-5683. 2011
A broadband analysis of the optical properties of silver nanoparticle films by in situ real time spectroscopic ellipsometry. 519:2936-2940. 2011
Dual rotating compensator ellipsometry: Theory and simulations. 519:2725-2729. 2011
Real time spectroscopic ellipsometry of Ag/ZnO and Al/ZnO interfaces for back-reflectors in thin film Si:H photovoltaics. 519:2682-2687. 2011
Optical and structural properties of solution deposited nickel manganite thin films. 519:2919-2923. 2011
Ultrasonically sprayed and inkjet printed thin film electrodes for organic solar cells. 517:2781-2786. 2009
Super hard cubic phases of period VI transition metal nitrides: First principles investigation. 517:824-827. 2008
Characterization of iridium oxide thin films deposited by pulsed-direct-current reactive sputtering. 515:7059-7065. 2007
Orientationdependent mobilities from analyses of two-dimensional TiN(111) island decay kinetics. 510:339-345. 2006
Hot-wire chemical vapor synthesis for a variety of nano-materials with novel applications. 501:216-220. 2006
Advances in multichannel ellipsometric techniques for in-situ and real-time characterization of thin films. 469-470:38-46. 2004
Analysis of the optical properties and structure of sculptured thin films from spectroscopic Mueller matrix ellipsometry. 455-456:571-575. 2004
Analytical model for the optical functions of amorphous semiconductors and its applications for thin film solar cells. 455-456:388-392. 2004
Application of spectral and temporal weighted error functions for data analysis in real-time spectroscopic ellipsometry. 455-456:106-111. 2004
Calibration and data reduction for a UV-extended rotating-compensator multichannel ellipsometer. 455-456:132-137. 2004
Evaluation of compositional depth profiles in mixed-phase (amorphous+crystalline) silicon films from real time spectroscopic ellipsometry. 455-456:665-669. 2004
Intrinsic and light induced gap states in a-Si:H materials and solar cells—effects of microstructure. 451-452:470-475. 2004
Multichannel Mueller matrix ellipsometer based on the dual rotating compensator principle. 455-456:14-23. 2004
Simultaneous determination of bulk isotropic and surface-induced anisotropic complex dielectric functions of semiconductors from high speed Mueller matrix ellipsometry. 455-456:196-200. 2004
High-rate deposition of amorphous silicon films using hot-wire CVD with a coil-shaped filament. 430:125-129. 2003
Hot-wire chemical vapor deposition of carbon nanotubes. 430:292-295. 2003
Hot-wire deposition of amorphous and microcrystalline silicon using different gas excitations by a coiled filament. 430:304-308. 2003
Real time analysis of amorphous and microcrystalline silicon film growth by multichannel ellipsometry. 364:129-137. 2000
Real-time spectroscopic ellipsometry from 1.5 to 6.5 eV. 364:16-21. 2000
Advances in multichannel spectroscopic ellipsometry. 313-314:18-32. 1998
Application of real-time spectroscopic ellipsometry for the development of low-temperature diamond film growth processes. 313-314:506-510. 1998
Depth-profiles in compositionally-graded amorphous silicon alloy thin films analyzed by real time spectroscopic ellipsometry. 313-314:474-478. 1998
Real time spectroscopic ellipsometry for characterization of the crystallization of amorphous silicon by thermal annealing. 313-314:464-468. 1998
Rotating-compensator multichannel transmission ellipsometry of a thin-film helicoidal bianisotropic medium. 313-314:373-378. 1998
Simultaneous determination of reflectance spectra along with {ψ(E), Δ(E)} in multichannel ellipsometry: applications to instrument calibration and reduction of real-time data. 313-314:79-84. 1998
Properties of heavily phosphorous-doped μc-Si deposited by mesh attached cathode-type r.f. glow discharge. 274:113-119. 1996
Thickness change in an annealed amorphous silicon film detected by spectroscopic ellipsometry. 279:174-179. 1996
Microcrystalline structure of poly-Si films prepared by cathode-type r.f. glow discharge. 256:234-239. 1995
Analysis of critical points in semiconductor optical functions from in situ and real-time spectroscopic ellipsometry. 233:272-275. 1993
Hydrogen diffusion and reaction processes in thin films investigated by real time spectroscopic ellipsometry. 233:276-280. 1993
Real time spectroscopic ellipsometry for characterization of nucleation, growth, and optical functions of thin films. 233:244-252. 1993
Instrumentation considerations in multichannel ellipsometry for real-time spectroscopy. 206:300-305. 1991
Real time spectroscopic ellipsometry for characterization of thin film optical properties and microstructural evolution. 206:374-380. 1991
Real-time spectroscopic ellipsometry for determination of the optical functions of ion-beam-deposited hydrogenated amorphous carbon. 193-194:361-370. 1990
Real-time spectroscopic ellipsometry study of theelectrochemical deposition of polypyrrole thin films. 193-194:350-360. 1990
Real-time and spectroscopic ellipsometry characterizatio of diamond and diamond-like carbon. 181:565-578. 1989
A study of the microstructure of a-Si:H using spectroscopic ellipsometry measurements. 129:127-138. 1985

category

MATERIALS SCIENCE, COATINGS & FILMS Category
MATERIALS SCIENCE, MULTIDISCIPLINARY Category
PHYSICS, APPLIED Category
PHYSICS, CONDENSED MATTER Category

International Standard Serial Number (ISSN)

0040-6090

Electronic International Standard Serial Number (EISSN)

1879-2731

journal abbreviation

THIN SOLID FILMS