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A study of the microstructure of a-Si:H using spectroscopic ellipsometry measurements
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
Biter, W.J.
Clark, A.H.
Windischmann, H.
publication date
1985
webpage
http://dx.doi.org/10.1016/0040-6090(85)90101-4
published in
THIN SOLID FILMS
Journal
Additional Document Info
number of pages
11
start page
127
end page
138
volume
129
issue
1-2