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Real time spectroscopic ellipsometry for characterization of thin film optical properties and microstructural evolution
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
An, Ilsin
Nguyen, H.V.
Gu, T.
publication date
1991
webpage
http://dx.doi.org/10.1016/0040-6090(91)90454-6
published in
THIN SOLID FILMS
Journal
Additional Document Info
number of pages
6
start page
374
end page
380
volume
206
issue
1-2