Toggle navigation
Browse
Home
People
Departments & Colleges
Research
Research Area Overlaps
Analysis of critical points in semiconductor optical functions from in situ and real-time spectroscopic ellipsometry
Article (Web of Science)
Overview
Additional Document Info
View All
Overview
authors
Nguyen, Hien V.
publication date
1993
webpage
http://dx.doi.org/10.1016/0040-6090(93)90106-y
published in
THIN SOLID FILMS
Journal
Additional Document Info
number of pages
3
start page
272
end page
275
volume
233
issue
1-2