APPLIED PHYSICS LETTERS Journal
Overview
publication venue for
- Band gap energy and near infrared to ultraviolet complex optical properties of single crystal TbScO3. 123. 2023
- Voltage deficit in PV with suppressed recombination. 123. 2023
- Threshold switching in solar cells and a no-scribe photovoltaic technology. 119. 2021
- On the design and performance of InGaN/Si double-junction photocathodes. 118. 2021
- The Poole-Frenkel laws and a pathway to multi-valued memory. 115. 2019
- Effect of surface hydroxyl groups on heat capacity of mesoporous silica. 112:201903. 2018
- The stochastic growth of metal whiskers. 110. 2017
- Buried homojunction in CdS/Sb2Se3 thin film photovoltaics generated by interfacial diffusion. 111:013901. 2017
- Column-by-column observation of dislocation motion in CdTe: Dynamic scanning transmission electron microscopy. 109. 2016
- Thermodynamic analysis of conductive filaments. 109. 2016
- Thermal equation of state of silicon carbide. 108. 2016
- Simultaneous shunt protection and back contact formation for CdTe solar cells with single wall carbon nanotube layers. 107. 2015
- Direct observation of electrical properties of grain boundaries in sputter-deposited CdTe using scan-probe microwave reflectivity based capacitance measurements. 107. 2015
- Surface stability and the selection rules of substrate orientation for optimal growth of epitaxial II-VI semiconductors. 107. 2015
- Unipolar self-doping behavior in perovskite CH3NH3PbBr3. 106. 2015
- Optical function spectra and bandgap energy of Cu2SnSe3. 106. 2015
- Light induced nucleation of metallic nanoparticles with frequency controlled shapes. 105. 2014
- Large-amplitude thermal oscillations in defected, tilted nanocolumns. 105. 2014
- Enhancing the photo-currents of CdTe thin-film solar cells in both short and long wavelength regions. 105. 2014
- Determination of heterojunction band offsets between CdS bulk and PbS quantum dots using photoelectron spectroscopy. 105. 2014
- Semi-shunt field emission in electronic devices. 105. 2014
- Origin of deep subgap states in amorphous indium gallium zinc oxide: Chemically disordered coordination of oxygen. 104. 2014
- CdTe thin-film solar cells with cobalt-phthalocyanine back contacts. 104. 2014
- Unusual defect physics in CH3NH3PbI3 perovskite solar cell absorber. 104. 2014
- Contribution of ions in radio frequency properties of atmospheric pressure microgaps. 105:253105. 2014
- Structural, electronic, and optical properties of Cu-3-V-VI4 compound semiconductors. 103. 2013
- Hot spot runaway in thin film photovoltaics and related structures. 103. 2013
- Large nonlinear optical coefficients in pseudo-tetragonal BiFeO3 thin films. 103. 2013
- Defect segregation at grain boundary and its impact on photovoltaic performance of CuInSe2. 102. 2013
- Effect of reduced dimensionality on the optical band gap of SrTiO3. 102. 2013
- Frequency response of atmospheric pressure gas breakdown in micro/nanogaps. 103:063102. 2013
- Pre-breakdown evaluation of gas discharge mechanisms in microgaps. 102:174102. 2013
- Growth analysis of (Ag,Cu)InSe2 thin films via real time spectroscopic ellipsometry. 101. 2012
- How grain boundaries in Cu(In,Ga)Se-2 thin films are charged: Revisit. 101. 2012
- Plasmonic mediated nucleation of resonant nano-cavities. 101. 2012
- Synthesis of the superlattice complex oxide Sr5Bi4Ti8O27 and its band gap behavior. 100. 2012
- Nucleation of metals by strong electric fields. 100. 2012
- Optical detection of melting point depression for silver nanoparticles via in situ real time spectroscopic ellipsometry. 100. 2012
- Origin of charge separation in III-nitride nanowires under strain. 99. 2011
- Optical transition energies as a probe of stress in polycrystalline CdTe thin films. 99. 2011
- Analysis of interband, intraband, and plasmon polariton transitions in silver nanoparticle films via in situ real-time spectroscopic ellipsometry. 98. 2011
- Development of a cold atmospheric pressure microplasma jet for freeform cell printing. 99:111502. 2011
- Broadening of optical transitions in polycrystalline CdS and CdTe thin films. 97. 2010
- Electric field driven optical recording. 97. 2010
- Shunting path formation in thin film structures. 96. 2010
- Enhanced conversion efficiencies for pillar array solar cells fabricated from crystalline silicon with short minority carrier diffusion lengths. 96:213503. 2010
- Optical properties of quasi-tetragonal BiFeO3 thin films. 96:131907. 2010
- Probing mixed tetragonal/rhombohedral-like monoclinic phases in strained bismuth ferrite films by optical second harmonic generation. 97:112903. 2010
- Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry. 94. 2009
- A unified model of nucleation switching. 94. 2009
- Optical band gap and magnetic properties of unstrained EuTiO3 films. 94:212509. 2009
- Spin-charge-lattice coupling through resonant multimagnon excitations in multiferroic BiFeO3. 94:161905. 2009
- From photovoltaics to medical imaging: Applications of thin-film CdTe in x-ray detection. 93. 2008
- Linear and nonlinear optical properties of multifunctional PbVO3 thin films. 92. 2008
- Evidence of field induced nucleation in phase change memory. 92. 2008
- Optical band gap of BiFeO(3) grown by molecular-beam epitaxy. 92. 2008
- Linear and nonlinear optical properties of BiFeO3. 92. 2008
- Nanodipole photovoltaics. 92. 2008
- Excimer laser fabrication of microbumps on platinum thin films. 91. 2007
- Nucleation switching in phase change memory. 90:123504. 2007
- Physics of ultrathin photovoltaics. 89. 2006
- Physical model of CdS-based thin-film photovoltaic junctions. 88. 2006
- Ab initio calculations for properties of MAX phases Ti2TlC, Zr2TlC, and Hf2TlC. 88:101911. 2006
- Acousto-optic-modulator-stabilized low-threshold mode-locked Nd:YVO4 laser. 89:221119. 2006
- Piezo-effect and physics of CdS-based thin-film photovoltaics. 87. 2005
- Aluminum nanoscale order in amorphous Al92Sm8 measured by fluctuation electron microscopy. 86:141910. 2005
- Blocking thin-film nonuniformities: Photovoltaic self-healing. 84:616-618. 2004
- Controllable excimer-laser fabrication of conical nano-tips on silicon thin films. 84:4881-4883. 2004
- Evidence from atomistic simulations of fluctuation electron microscopyfor preferred local orientations in amorphous silicon. 85:745-747. 2004
- Lock-in thermography and nonuniformity modeling of thin-film CdTe solar cells. 84:729-731. 2004
- Reach-through band bending in semiconductor thin films. 85:3617-3619. 2004
- Super-resolution in laser annealing and ablation. 84:2391-2393. 2004
- Absence of carrier recombination associated with the defect pool model in intrinsic amorphous silicon layers: Evidence from current–voltage characteristics on p–i–n and n–i–p solar cells. 82:3023-3025. 2003
- Large optical nonlinearities in BiMnO3 thin films. 83:5169-5171. 2003
- Light-induced defect states in hydrogenated amorphous silicon centered around 1.0 and 1.2 eV from the conduction band edge. 83:3725-3727. 2003
- Low-light divergence in photovoltaic parameter fluctuations. 82:2157-2159. 2003
- Bias-dependent photoluminescence in CdTe photovoltaics. 80:3114-3116. 2002
- Effects of nonuniformity in thin-film photovoltaics. 80:4256-4258. 2002
- Extended phase diagrams for guiding plasma-enhanced chemical vapor deposition of silicon thin films for photovoltaics applications. 80:2666-2668. 2002
- Hot wire chemical vapor deposition of isolated carbon single-walled nanotubes. 81:4061-4063. 2002
- Maximization of the open circuit voltage for hydrogenated amorphous silicon n–i–p solar cells by incorporation of protocrystalline silicon p-type layers. 81:1258-1260. 2002
- Auger recombination in heavily carbon-doped GaAs. 78:1879-1881. 2001
- Auger recombination in low-band-gap n-type InGaAs. 79:3272-3274. 2001
- Ultraviolet-extended real-time spectroscopic ellipsometry for characterization of phase evolution in BN thin films. 78:1982-1984. 2001
- Dependence of open-circuit voltage in hydrogenated protocrystalline silicon solar cells on carrier recombination in p/i interface and bulk regions. 77:3093-3095. 2000
- Analysis of contamination, hydrogen emission, and surface temperature variations using real time spectroscopic ellipsometry during p/i interface formation in amorphous silicon p-i-n solar cells. 74:3687-3689. 1999
- Evolutionary phase diagrams for plasma-enhanced chemical vapor deposition of silicon thin films from hydrogen-diluted silane. 75:2286-2288. 1999
- Performance and stability of Si:H p–i–n solar cells with i layers prepared at the thickness-dependent amorphous-to-microcrystalline phase boundary. 75:1553-1555. 1999
- An improved analysis for band edge optical absorption spectra in hydrogenated amorphous silicon from optical and photoconductivity measurements. 72:1057-1059. 1998
- Optical depth profiling of band gap engineered interfaces in amorphous silicon solar cells at monolayer resolution. 72:2993-2995. 1998
- Optimization of hydrogenated amorphous silicon p–i–n solar cells with two-step i layers guided by real-time spectroscopic ellipsometry. 73:1526-1528. 1998
- Recombination lifetime of In0.53Ga0.47As as a function of doping density. 72:3470-3472. 1998
- Rotating-compensator multichannel ellipsometry for characterization of the evolution of nonuniformities in diamond thin-film growth. 72:900-902. 1998
- X-ray photoelectron spectroscopy study of excimer laser treated alumina films. 72:31-33. 1998
- Application of real time spectroscopic ellipsometry for high resolution depth profiling of compositionally graded amorphous silicon alloy thin films. 70:2150-2152. 1997
- Low temperature plasma process based on CO-rich CO/H2 mixtures for high rate diamond film deposition. 70:1527-1529. 1997
- Transmission ellipsometry of a thin-film helicoidal bianisotropic medium. 71:1180-1182. 1997
- Correlation of real time spectroellipsometry and atomic force microscopy measurements of surface roughness on amorphous semiconductor thin films. 69:1297-1299. 1996
- Nucleation and bulk film growth kinetics of nanocrystalline diamond prepared by microwave plasma‐enhanced chemical vapor deposition on silicon substrates. 69:1716-1718. 1996
- Spectroellipsometry for characterization of Zn1−xCdxSe multilayered structures on GaAs. 69:2273-2275. 1996
- Meyer–Neldel rule for liquid semiconductors. 66:997-999. 1995
- Optical characterization of continuous compositional gradients in thin films by real time spectroscopic ellipsometry. 67:3010-3012. 1995
- Real time spectroscopic ellipsometry study of hydrogenated amorphous silicon p‐i‐n solar cells: Characterization of microstructural evolution and optical gaps. 67:2669-2671. 1995
- Preparation of ultrathin microcrystalline silicon layers by atomic hydrogen etching of amorphous silicon and end‐point detection by real time spectroellipsometry. 65:3335-3337. 1994
- Real time spectroellipsometry study of the interaction of hydrogen with ZnO during ZnO/a‐Si1−xCxH interface formation. 64:3317-3319. 1994
- Effects of microstructure on transport properties of undoped hydrogenated amorphous silicon films. 63:955-957. 1993
- Enhancement and stabilization of porous silicon photoluminescence by oxygen incorporation with a remote‐plasma treatment. 62:1152-1154. 1993
- Nucleation and growth of hydrogenated amorphous silicon‐carbon alloys: Effect of hydrogen dilution in plasma‐enhanced chemical vapor deposition. 63:2228-2230. 1993
- In‐process ellipsometric monitoring of diamond film growth by microwave plasma enhanced chemical vapor deposition. 60:2868-2870. 1992
- Monitoring ion etching of GaAs/AlGaAs heterostructures by real time spectroscopic ellipsometry: Determination of layer thicknesses, compositions, and surface temperature. 60:2776-2778. 1992
- Effect of surface recombination on the spectral dependence of photocurrent in intrinsic hydrogenated amorphous silicon films. 59:2549-2551. 1991
- In situ determination of dielectric functions and optical gap of ultrathin amorphous silicon by real time spectroscopic ellipsometry. 59:2543-2545. 1991
- Mechanistic investigations of nanometer‐scale lithography at liquid‐covered graphite surfaces. 58:1389-1391. 1991
- Spectroellipsometry characterization of optical quality vapor‐deposited diamond thin films. 58:819-821. 1991
- Atomic resolution imaging of electrode surfaces in solutions containing reversible redox species. 54:1421-1423. 1989
- Insitustudy ofp‐type amorphous silicon growth from B2H6:SiH4mixtures: Surface reactivity and interface effects. 53:1086-1088. 1988
- Surface, interface, and bulk properties of amorphous carbon films characterized byinsituellipsometry. 52:2025-2027. 1988
- Effect of substrate temperature on the nucleation of glow discharge hydrogenated amorphous silicon. 49:1207-1209. 1986
- Insituinvestigation of the nucleation of microcrystalline Si. 48:843-845. 1986
- Erratum: Auger recombination in low-band-gap n-type InGaAs [Appl. Phys. Lett. 79, 3272 (2001)] 2003
- Comment on "Threshold switching via electric field induced crystallization in phase change memory devices" [Appl. Phys. Lett. 100, 253105 (2012)] 2013
Research
category
- PHYSICS, APPLIED Category
Identity
International Standard Serial Number (ISSN)
- 0003-6951
Electronic International Standard Serial Number (EISSN)
- 1077-3118
Other
journal abbreviation
- APPL PHYS LETT