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Analysis of contamination, hydrogen emission, and surface temperature variations using real time spectroscopic ellipsometry during p/i interface formation in amorphous silicon p-i-n solar cells
Article (Web of Science)
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Additional Document Info
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authors
Fujiwara, H.
Koh, Joohyun
Wronski, C. R.
publication date
1999
webpage
http://dx.doi.org/10.1063/1.123230
published in
APPLIED PHYSICS LETTERS
Journal
Additional Document Info
number of pages
2
start page
3687
end page
3689
volume
74
issue
24