Analysis of contamination, hydrogen emission, and surface temperature variations using real time spectroscopic ellipsometry during p/i interface formation in amorphous silicon p-i-n solar cells Article (Web of Science)

authors

publication date

  • 1999

published in

number of pages

  • 2

start page

  • 3687

end page

  • 3689

volume

  • 74

issue

  • 24