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Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry
Article (Web of Science)
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cited authors
Walker, J. D.; Khatri, H.; Ranjan, V.; Li, Jian; Collins, R. W.; Marsillac, S.
publication date
April 6, 2009
webpage
Web of Science
published in
APPLIED PHYSICS LETTERS
Journal
Research
author keyword
copper compounds
electrodes
electron relaxation time
ellipsometry
gallium compounds
grain size
high-pressure effects
indium compounds
metallic thin films
molybdenum
nucleation
solar cells
sputter deposition
ternary semiconductors
voids (solid)
category
PHYSICS, APPLIED
Category
Additional Document Info
volume
94
issue
14