Electronic and structural properties of molybdenum thin films as determined by real-time spectroscopic ellipsometry Article (Web of Science)

cited authors

  • Walker, J. D.; Khatri, H.; Ranjan, V.; Li, Jian; Collins, R. W.; Marsillac, S.

publication date

  • April 6, 2009

webpage

published in

author keyword

  • copper compounds
  • electrodes
  • electron relaxation time
  • ellipsometry
  • gallium compounds
  • grain size
  • high-pressure effects
  • indium compounds
  • metallic thin films
  • molybdenum
  • nucleation
  • solar cells
  • sputter deposition
  • ternary semiconductors
  • voids (solid)

category

volume

  • 94

issue

  • 14