Evidence from atomistic simulations of fluctuation electron microscopyfor preferred local orientations in amorphous silicon Article (Web of Science)

authors

  • Khare, Sanjay
  • Nakhmanson, S. M.
  • Voyles, P. M.
  • Keblinski, P.
  • Abelson, J. R.

publication date

  • 2004

webpage

published in

number of pages

  • 2

start page

  • 745

end page

  • 747

volume

  • 85

issue

  • 5