Direct observation of electrical properties of grain boundaries in sputter-deposited CdTe using scan-probe microwave reflectivity based capacitance measurements Article (Web of Science)

cited authors

  • Tuteja, Mohit; Koirala, Prakash; MacLaren, Scott; Collins, Robert; Rockett, Angus

publication date

  • October 5, 2015

webpage

published in

category

volume

  • 107

issue

  • 14