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Direct observation of electrical properties of grain boundaries in sputter-deposited CdTe using scan-probe microwave reflectivity based capacitance measurements
Article (Web of Science)
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cited authors
Tuteja, Mohit; Koirala, Prakash; MacLaren, Scott; Collins, Robert; Rockett, Angus
publication date
October 5, 2015
webpage
Web of Science
published in
APPLIED PHYSICS LETTERS
Journal
Research
category
PHYSICS, APPLIED
Category
Additional Document Info
volume
107
issue
14