Spectroellipsometry for characterization of Zn1−xCdxSe multilayered structures on GaAs Article (Web of Science)

authors

  • Lee, Joungchel
  • Heyd, A. R.
  • Flack, F.
  • Samarth, N.

publication date

  • 1996

webpage

published in

number of pages

  • 2

start page

  • 2273

end page

  • 2275

volume

  • 69

issue

  • 15