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Spectroellipsometry for characterization of Zn1−xCdxSe multilayered structures on GaAs
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
Lee, Joungchel
Collins, Robert W
Heyd, A. R.
Flack, F.
Samarth, N.
publication date
1996
webpage
http://dx.doi.org/10.1063/1.117531
published in
APPLIED PHYSICS LETTERS
Journal
Additional Document Info
number of pages
2
start page
2273
end page
2275
volume
69
issue
15