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In‐process ellipsometric monitoring of diamond film growth by microwave plasma enhanced chemical vapor deposition
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
Hayashi, Yasuaki
Drawl, William
Messier, Russell
publication date
1992
webpage
http://dx.doi.org/10.1063/1.106827
published in
APPLIED PHYSICS LETTERS
Journal
Additional Document Info
number of pages
2
start page
2868
end page
2870
volume
60
issue
23