APPLIED SURFACE SCIENCE Journal

publication venue for

Optical gradients in a-Si:H thin films detected using real-time spectroscopic ellipsometry with virtual interface analysis. 436:779-784. 2018
Ellipsometric study of the optical response of ZnS:Cr for PV applications. 421:315-319. 2017
Optical properties of InP from infrared to vacuum ultraviolet studied by spectroscopic ellipsometry. 421:813-818. 2017
Spectroscopic ellipsometry determination of optical and electrical properties of aluminum doped zinc oxide. 421:852-858. 2017
Spectroscopic ellipsometry for analysis of polycrystalline thin-film photovoltaic devices and prediction of external quantum efficiency. 421:601-607. 2017
Enhancement of gas sensor response of nanocrystalline zinc oxide for ammonia by plasma treatment. 309:46-53. 2014
Surface and gas sensing properties of nanocrystalline nickel oxide thin films. 276:291-297. 2013
Photoelectrochemical behavior of mixed ZnO and GaN (ZnO:GaN) thin films prepared by sputtering technique. 270:718-721. 2013
Polymer-templated mesoporous carbons synthesized in the presence of nickel nanoparticles, nickel oxide nanoparticles, and nickel nitrate. 258:3763-3770. 2012
The effect of UV irradiation on nanocrysatlline zinc oxide thin films related to gas sensing characteristics. 257:5398-5402. 2011
Fabrication of cuprous and cupric oxide thin films by heat treatment. 255:9474-9479. 2009
Functionalization of carbon nanofibers with elastomeric block copolymer using carbodiimide chemistry. 255:4806-4813. 2009
Amorphous and crystalline IrO(2) thin films as potential stimulation electrode coatings. 254:5164-5169. 2008
The ultimate in real-time ellipsometry: Multichannel Mueller matrix spectroscopy. 253:38-46. 2006
Excimer laser modification of thin AlN films. 249:45-53. 2005
Nanocrystalline WO3 films prepared by two-step annealing. 244:453-457. 2005
An XPS study of laser-fabricated polyimide/titanium interfaces. 236:71-76. 2004
Ferroelectric behavior in solvent cast poly(vinylidene fluoride/hexafluoropropylene) copolymer films. 175-176:386-390. 2001
Recent progress in thin film growth analysis by multichannel spectroscopic ellipsometry. 154-155:217-228. 2000
Determination of optical properties of amorphous and crystalline thin films by spectroellipsometry. 113-114:493-498. 1997
Structural properties of poly-Si deposited by rf glow discharge using 100% SiH4. 113-114:462-466. 1997
Ellipsometric study of thermal and laser annealed amorphous and microcrystalline silicon films. 92:300-305. 1996

category

CHEMISTRY, PHYSICAL Category
MATERIALS SCIENCE, COATINGS & FILMS Category
PHYSICS, APPLIED Category
PHYSICS, CONDENSED MATTER Category

International Standard Serial Number (ISSN)

0169-4332

Electronic International Standard Serial Number (EISSN)

1873-5584

journal abbreviation

APPL SURF SCI