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Ellipsometric study of thermal and laser annealed amorphous and microcrystalline silicon films
Article (Web of Science)
Overview
Additional Document Info
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Overview
authors
Jayatissa, Ahalapitiya H
Suzuki, Michio
Nakanishi, Yoichiro
Hatanaka, Yoshinori
publication date
1996
webpage
http://dx.doi.org/10.1016/0169-4332(95)00246-4
published in
APPLIED SURFACE SCIENCE
Journal
Additional Document Info
number of pages
5
start page
300
end page
305
volume
92