Diamond and Related Materials Journal

publication venue for

Multichannel ellipsometry from 1.5 to 6.5 eV for real time characterization of wide band gap materials: phase identification in boron nitride thin films. 10:1304-1310. 2001
Ultrananocrystalline diamond thin films for MEMS and moving mechanical assembly devices. 10:1952-1961. 2001
Analysis of the ellipsometric spectra of amorphous carbon thin films for evaluation of the sp3-bonded carbon content. 7:999-1009. 1998
Effects of processing conditions on the growth of nanocrystalline diamond thin films: real time spectroscopic ellipsometry studies. 6:55-80. 1997
Real-time spectroscopic ellipsometry studies of diamond film growth by microwave plasma-enhanced chemical vapour deposition. 3:431-437. 1994

publisher

Elsevier BV Publisher

International Standard Serial Number (ISSN)

0925-9635