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Diamond and Related Materials
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publication venue for
Multichannel ellipsometry from 1.5 to 6.5 eV for real time characterization of wide band gap materials: phase identification in boron nitride thin films
. 10:1304-1310.
2001
Ultrananocrystalline diamond thin films for MEMS and moving mechanical assembly devices
. 10:1952-1961.
2001
Analysis of the ellipsometric spectra of amorphous carbon thin films for evaluation of the sp3-bonded carbon content
. 7:999-1009.
1998
Effects of processing conditions on the growth of nanocrystalline diamond thin films: real time spectroscopic ellipsometry studies
. 6:55-80.
1997
Real-time spectroscopic ellipsometry studies of diamond film growth by microwave plasma-enhanced chemical vapour deposition
. 3:431-437.
1994
publisher
Elsevier BV
Publisher
Identity
International Standard Serial Number (ISSN)
0925-9635