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Multichannel ellipsometry from 1.5 to 6.5 eV for real time characterization of wide band gap materials: phase identification in boron nitride thin films
Article (Web of Science)
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Additional Document Info
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Overview
authors
Zapien, J.A
Messier, R
publication date
2001
webpage
http://dx.doi.org/10.1016/s0925-9635(00)00600-2
published in
Diamond and Related Materials
Journal
Additional Document Info
number of pages
6
start page
1304
end page
1310
volume
10
issue
3-7