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JOURNAL OF NANOPHOTONICS
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Overview
publication venue for
Analysis of the optical properties and structure of serial bi-deposited TiO2 chiral sculptured thin films using Mueller matrix ellipsometry
. 2.
2008
Research
category
NANOSCIENCE & NANOTECHNOLOGY
Category
OPTICS
Category
Identity
International Standard Serial Number (ISSN)
1934-2608
Other
journal abbreviation
J NANOPHOTONICS