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Real time spectroscopic ellipsometry determination of the evolution of amorphous semiconductor optical functions, bandgap, and microstructure
Article (Web of Science)
Overview
Additional Document Info
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authors
Li, Y.M.
An, Ilsin
Nguyen, H.V.
Wronski, C.R.
publication date
1991
webpage
http://dx.doi.org/10.1016/s0022-3093(05)80238-8
published in
JOURNAL OF NON-CRYSTALLINE SOLIDS
Journal
Additional Document Info
number of pages
3
start page
787
end page
790
volume
137-138