Real time spectroscopic ellipsometry determination of the evolution of amorphous semiconductor optical functions, bandgap, and microstructure Article (Web of Science)

authors

  • Li, Y.M.
  • An, Ilsin
  • Nguyen, H.V.
  • Wronski, C.R.

publication date

  • 1991

webpage

published in

number of pages

  • 3

start page

  • 787

end page

  • 790

volume

  • 137-138